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Young’s modulus in nanostructured metals

  • Y. Zhou EMAIL logo , U. Erb , K. T. Aust und G. Palumbo
Veröffentlicht/Copyright: 7. Februar 2022
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Abstract

The interface effect on Young’s modulus was investigated in electro-deposited fully-dense Ni –P alloys with a relatively constant phosphorus content (2– 3 wt%), but with different grain sizes ranging from 4 to 29 nm. Essentially the same Young’s modulus was observed for grain sizes ≥ 18 nm. A noticeable decrease in Young’s modulus was found at grain sizes ≤ 17 nm. The reduction in Young’s modulus was found to correlate well with the increase in all interface contributions. These observations agree with various studies on other fully-dense metals for grain sizes between 5 and 80 nm. Previously reported large decreases in the Young’s modulus were likely caused by the significant amount of porosity in the microstructure.


Yijian Zhou Dept. of Materials Science and Engineering University of Toronto 184 College Str., Toronto, Ontario, Canada M5S 3E4 Tel.: +1 416 946 3315 Fax: +1 416 946 3316

Dedicated to Professor Dr. Dr. h. c. Herbert Gleiter on the occasion of his 65th birthday


  1. The authors would like to thank Shimadzu Corporation for their generous donation of the nanoindenter, and Dr. G. Hibbard from Integran Technology Inc. for his contributions. Financial support from the Natural Sciences and Engineering Research Council of Canada and the Ontario Graduate Scholarship is gratefully acknowledged.

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Received: 2003-05-27
Published Online: 2022-02-07

© 2003 Carl Hanser Verlag, München

Artikel in diesem Heft

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  2. Articles/Aufsätze
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  4. Interface stress in nanocrystalline materials
  5. Microstructure, frequency and localisation of pseudo-elastic fatigue strain in NiTi
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  17. Low-temperature plasma nitriding of AISI 304 stainless steel with nano-structured surface layer
  18. New materials from non-intuitive composite effects
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  20. Young’s modulus in nanostructured metals
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  23. Personal/Personelles
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