Phase formation and electrical properties study of PVDF thick films synthesized by solution casting method
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A P Kajal Parida
Abstract
In this study, polyvinylidene fluoride (PVDF) thick films with thickness ∼180 µm were synthesized by solution casting. X-ray diffraction study established the co-existence of both α and β-phases. Raman spectroscopy of the synthesized PVDF thick films corroborated the existence of α and β-phases in 0.71:1 ratio. Surface micrographs of PVDF thick films showed dense microstructure with grain size ∼10 µm. Additionally, the room temperature values of dielectric constant and dielectric loss at 100 kHz were measured to be ∼20 and 0.33, respectively. Furthermore, ferroelectric behavior of PVDF thick films was confirmed by the polarization versus electric field (P–E) hysteresis loop study. A leakage current density of 1.55 × 10−5 A cm−2 at an applied electric field of 500 kV cm−1 was obtained in PVDF thick films.
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Author contributions: All the authors have accepted responsibility for the entire content of this submitted manuscript and approved submission.
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Research funding: None declared.
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Conflict of interest statement: The authors declare no conflicts of interest regarding this article.
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