Home Electronic structure investigations of Ni and Cr films on (100)SrTiO3 substrates using electron energy-loss spectroscopy
Article
Licensed
Unlicensed Requires Authentication

Electronic structure investigations of Ni and Cr films on (100)SrTiO3 substrates using electron energy-loss spectroscopy

  • Klaus van Benthem EMAIL logo , Christine Scheu , Wilfried Sigle and Manfred Rühle
Published/Copyright: January 3, 2022
Become an author with De Gruyter Brill

Abstract

Metal/ceramic interfaces between thin nickel and chromium films and the TiO2 terminated (100) surface of SrTiO3 were studied by various transmission electron microscopy techniques to investigate the bonding behaviour between film and substrate. For the Ni/SrTiO3 interface, a semi-coherent interface structure between three-dimensionally grown Ni islands and the SrTiO3 substrate was observed. From electron energy-loss spectroscopy measurements and high-resolution transmission electron microscopy studies, the formation of a two-dimensional NiO layer at the interface was concluded, which dominates the adhesion between the Ni film and the ceramic substrate. At the Cr/SrTiO3 interface, Cr –O bonds were found, possessing an ionic-bonding contribution. Comparing the bonding characteristics of Ni and Cr on the (100) surface of SrTiO3, a stronger adhesion of Cr than for Ni is proposed.


Klaus van Benthem Max-Planck-Institut für Metallforschung Heisenbergstr. 3, D-70569 Stuttgart, Germany Tel.: +49 711 689 3686 Fax: +49 711 689 3522

  1. The authors would like to express their gratitude to A. Polli, G. Richter, Q. Fu, and T. Wagner for specimen preparation by MBE and for fruitful discussions. The help of J. Thomas for his constant support during the STEM measurements is gratefully acknowledged. Thanks also to U. Salzberger for her invaluable help in preparing excellent TEM specimens.

References

1 Henrich, V.E.; Dresselhaus, G.; Zeiger, H.J.: Phys. Rev. B 17 (1978) 4908.10.1103/PhysRevB.17.4908Search in Google Scholar

2 Uchino, K., in: M. Swain, R. W. Cahn, P. Haasen E. J. Kramer (eds.), Ferroelectric Ceramics, VCH, Weinheim (1994) 635.Search in Google Scholar

3 Meixner, H.; Gerblinger, J.; Lampe, U.; Fleischer, M.: Sensors and Actuators B 23 (1995) 119.10.1016/0925-4005(94)01266-KSearch in Google Scholar

4 Setter, N.; Waser, R.: Acta mater. 48 (2000) 151.10.1016/S1359-6454(99)00293-1Search in Google Scholar

5 Chaudhari, P.; Koch, R.H.; Laibowitz, R.B.; McGuire, T.R.; Gambino, R.J.: Phys. Rev. Lett. 58 (1987) 2684.10.1103/PhysRevLett.58.2684Search in Google Scholar

6 Howe, J.M.: Int. Mater. Rev. 38 (1993) 233.10.1179/imr.1993.38.5.233Search in Google Scholar

7 Howe, J.M.: Int. Mater. Rev. 38 (1993) 257.10.1179/imr.1993.38.5.257Search in Google Scholar

8 Finnis, M.W.: J. Phys.: Condens. Matter 8 (1996) 5811.Search in Google Scholar

9 Ernst, F.: Mater. Sci. Eng. R 14 (1995) 97.10.1016/0927-796X(95)80001-8Search in Google Scholar

10 Ernst, F.; Pirouz, P.; Heuer, A.H.: Phil. Mag. A 63 (1991) 259.10.1080/01418619108204849Search in Google Scholar

11 Trampert, A.; Ernst, F.; Flynn, C.P.; Fischmeister, H.F.; Rühle, M.: Acta mater. 40 (1992) 227.10.1016/0956-7151(92)90281-ISearch in Google Scholar

12 Möbus, G.; Rühle, M.: Ultramicroscopy 56 (1994) 54.10.1016/0304-3991(94)90146-5Search in Google Scholar

13 Rühle, M.: J. Eur. Ceram. Soc. 16 (1996) 353.10.1016/0955-2219(95)00194-8Search in Google Scholar

14 Dehm, G.; Scheu, C.; Möbus, G.; Brydson, R.; Rühle, M.: Ultramicroscopy 67 (1997) 207.10.1016/S0304-3991(97)00004-1Search in Google Scholar

15 Gutekunst, G.; Mayer, J.; Rühle, M.: Phil. Mag. A 75 (1997) 1329.10.1080/01418619708209859Search in Google Scholar

16 Schweinfest, R.; Ernst, F.; Wagner, T.; Rühle, M.: J. of Microscopy 194 (1999) 142.10.1046/j.1365-2818.1999.00465.xSearch in Google Scholar

17 Brydson, R.; Bruley, J.; Müllejans, H.; Scheu, C.; Rühle, M.: Ultramicroscopy 59 (1995) 81.10.1016/0304-3991(95)00020-2Search in Google Scholar

18 Müllejans, H.; Bruley, J.: J. Microscopy 180 (1995) 12.10.1111/j.1365-2818.1995.tb03652.xSearch in Google Scholar

19 Scheu, C.; Dehm, G.; Müllejans, H.; Brydson, R.; Rühle, M.: Microsc. Microanal. Microstruct. 6 (1995) 19.10.1051/mmm:1995104Search in Google Scholar

20 Browning, N.D.; Wallis, D.J.; Nellist, P.D.; Pennycook, S.J.: Micron 28 (1997) 333.10.1016/S0968-4328(97)00033-4Search in Google Scholar

21 van Benthem, K.: Ph.D. Thesis, Univ. Stuttgart (2002).Search in Google Scholar

22 van Benthem, K.; Elsässer, C.: in preparation (2002).Search in Google Scholar

23 Egerton, R.F.: Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1996).10.1007/978-1-4757-5099-7Search in Google Scholar

24 Rez, P.; Bruley, J.; Brohan, P.; Payne, M.; Garvie, L.A.J.: Ultramicroscopy 59 (1995) 159.10.1016/0304-3991(95)00025-VSearch in Google Scholar

25 Bruley, J.: Microsc. Microanal. Microstruct. 4 (1993) 23.10.1051/mmm:019930040102300Search in Google Scholar

26 Gu, H.: Ultramicroscopy 76 (1999) 159.10.1016/S0304-3991(98)00083-7Search in Google Scholar

27 Gu, H.: Ultramicroscopy 76 (1999) 173.10.1016/S0304-3991(99)00003-0Search in Google Scholar

28 Nufer, S.; Marinopoulos, A.G.; Gemming, T.; Elsässer, C.; Kurtz, W.; Köstlmeier, S.; Rühle, M.: Phys. Rev. Lett. 86 (2001) 5066.10.1103/PhysRevLett.86.5066Search in Google Scholar

29 van Benthem, K.; Krämer, S.; Sigle,W.; Rühle, M.: Mikrochimica Acta (2002).Search in Google Scholar

30 Imhoff, D.; Laurant, S.; Colliex, C.; Backhaus-Ricoult, M.: Eur. Phys. J. AP 5 (1999) 9.10.1051/epjap:1999107Search in Google Scholar

31 Muller, D.A.; Shashkov, D.A.; Benedek, R.; Yang, L.H.; Silcox, J.: Phys. Rev. Lett. 80 (1998) 4741.10.1103/PhysRevLett.80.4741Search in Google Scholar

32 Scheu, C.; Dehm, G.; Rühle, M.; Brydson, R.: Phil. Mag. A 78 (1998) 439.10.1080/01418619808241913Search in Google Scholar

33 Wagner, T.; Richter, G.; Rühle, M.: J. Appl. Phys. 89 (2001) 2606.10.1063/1.1338987Search in Google Scholar

34 Ochs, T.; Köstlmeier, S.; Elsässer, C.: Integr. Ferroelectrics 32 (2001) 959.10.1080/10584580108215697Search in Google Scholar

35 Ochs, T.: Ph.D. Thesis, Univ. Stuttgart (2000).Search in Google Scholar

36 Polli, A.D.;Wagner, T.; Gemming, T.; Rühle, M.: Surface Sci. 448 (2000) 279.10.1016/S0039-6028(99)01233-9Search in Google Scholar

37 Kawasaki, M.; Takahashi, K.; Maeda, T.; Tsuchiya, R.; Shinohara, M.; Ishiyama, O.; Yonezawa, T.; Yoshimoto, M.; Koinuma, H.: Science 266 (1994) 1540.10.1126/science.266.5190.1540Search in Google Scholar

38 Yoshimoto, M.; Maeda, T.; Shimozono, K.; Koinuma, H.; Shinohara, M.; Ishiyama, O.; Ohtani, F.: Appl. Phys. Lett. 65 (1994) 3197.10.1063/1.112988Search in Google Scholar

39 Polli, A.D.; Wagner, T.; Rühle, M.: Surface Sci. 429 (1999) 237.10.1016/S0039-6028(99)00383-0Search in Google Scholar

40 Strecker, A.; Salzberger, U.; Mayer, J.: Prakt. Metallogr. 30 (1993) 482.10.1515/pm-1993-301002Search in Google Scholar

41 Phillipp, F.; Höschen, R.; Osaki, M.; Möbus, G.; Rühle, M.: Ultramicroscopy 56 (1994) 1.10.1016/0304-3991(94)90141-4Search in Google Scholar

42 Höschen, R.; Sigle, W.; Phillipp, F., in: Proc. EUREM 12, Dublin (1996) 273.Search in Google Scholar

43 Brydson, R.: EMSA Bull. 21 (1991) 57.Search in Google Scholar

44 Aebi, P.; Erbudak, M.; Vvedensky, D. D.; Kostorz, G.: Phys. Rev. B 42 (1990) 5369.10.1103/PhysRevB.42.5369Search in Google Scholar

45 Scheu, C.; Stein, W.; Rühle, M.: Phys. Stat. Sol. 222 (2000) 199.10.1002/1521-3951(200011)222:1<199::AID-PSSB199>3.0.CO;2-2Search in Google Scholar

46 Leapman, R.D.; Grunes, L.A.: Phys. Rev. Lett. 45 (1980) 397.10.1103/PhysRevLett.45.397Search in Google Scholar

47 Leapman, R.D.; Grunes, L.A.; Fejes, P. L.: Phys. Rev. B 26 (1982) 614.10.1103/PhysRevB.26.614Search in Google Scholar

48 van Aken, P.A.; Liebscher, B.; Stryrsa, V.J.: Phys. Chem. Miner. 25 (1998) 323.10.1007/s002690050122Search in Google Scholar

49 Garvie, L.A.J.;Buseck, P.R.: Nature 396 (1998) 667.10.1038/25334Search in Google Scholar

50 Polli, A.D.; Wagner, T.: Unpublished results (1998).Search in Google Scholar

51 Fu, Q.; Wagner, T.: Submitted to Surf. Sci. (2002).Search in Google Scholar

52 de Groot, F.M.F.; Grioni, M.; Fuggle, J.C.; Ghijssen, J.A.; Sawatzky, G.; Petersen, H.: Phys. Rev. B 40 (1989) 5715.10.1103/PhysRevB.40.5715Search in Google Scholar

53 Manoubi, T.; Tencé, N.; Walls, M.G.; Colliex, C.: Microsc. Microanal. Microstruct. 1 (1990) 23.10.1051/mmm:019900010102300Search in Google Scholar

54 Kido, Y.; Nishimura, T.; Hoshino, Y.; Namba, H.: Nucl. Instr. Meth. Phys. Res. B 161 –163 (2000) 371.10.1016/S0168-583X(99)00715-6Search in Google Scholar

55 Rehr, J.J.; Albers, R.C.: Phys. Rev. B 41 (1990) 8139.10.1103/PhysRevB.41.8139Search in Google Scholar

56 Rehr, J.J.; Albers, R.C.: Rev. Mod. Phys. 72 (2000) 621.10.1103/RevModPhys.72.621Search in Google Scholar

57 Massalski, T. B. (Editor-in-Chief): Binary Alloy Phase Diagrams, ASM International, Materials Park, OH (1990).Search in Google Scholar

58 Tanaka, I.; Mizuno, M.; Nakajyo, S.; Adachi, A.: Acta mater. 46 (1998) 6511.10.1016/S1359-6454(98)00288-2Search in Google Scholar

59 Tsukimoto, S.; Scheu, C.: Unpublished results (2001).Search in Google Scholar

60 Classen, T.; Elsässer, C.: Unpublished results (2002).Search in Google Scholar

61 Samsonov, G.V.: The Oxide Handbook, IFI/Plenum, New York (1973).10.1007/978-1-4615-9597-7Search in Google Scholar

Received: 2002-02-27
Published Online: 2022-01-03

© 2002 Carl Hanser Verlag, München

Downloaded on 16.11.2025 from https://www.degruyterbrill.com/document/doi/10.3139/ijmr-2002-1064/pdf
Scroll to top button