Abstract
Grain growth and texture development of magnetron-sputtered Ni films on thermally oxidized Si wafers were investigated as a function of sputtering and annealing atmospheres. Ni films of 1 μm thickness were sputtered in either pure Ar or an Ar–H2 gas mixture and subsequently annealed in high vacuum or a hydrogen atmosphere at 800 °C. The films were characterized by focused ion-beam microscopy and X-ray diffraction. The Ni films had a strong {111} texture after sputtering. Films sputtered in an Ar–H2 mixture and annealed in H2 underwent abnormal grain growth, resulting in a {100} texture. These films had a mean grain diameter of about 50 mm. The unusual abnormal grain growth is believed to be caused by a cleaning of the Ni films during sputtering and annealing in H2.
References
1 Glocker, D.A.; Shah, S.I.: Handbook of Thin Film Process Technology, Institute of Physics Publishing, Bristol (1998).Suche in Google Scholar
2 M. Ohring: The Materials Science of Thin Films, Academic Press, London (1992).Suche in Google Scholar
3 Mullins, W.W.: Acta Metall. 6 (1958) 414.10.1016/0001-6160(58)90020-8Suche in Google Scholar
4 Novikov, V.I.: Grain Growth and Control of Microstructure and Texture in Polycrystalline Materials, CRC Series in Materials Science and Technology, CRC Press, London (1997).Suche in Google Scholar
5 Thompson, C.V.: Ann. Rev. Mater. Sci. 44 (1990) 657.Suche in Google Scholar
6 Takewaki, T.; Yamada, H.; Shibata, T.; Ohmi, T.; Nitta, T.: Mater. Chem. Physics 41 (1995) 182.10.1016/0254-0584(95)01512-4Suche in Google Scholar
7 Dong, L.; Srolovitz, D.J: J. Appl. Phys. 84 (1998) 5261.10.1063/1.368794Suche in Google Scholar
8 Gotho, Y.; Yoshii, H.; Amioka, T.; Kameyama, K.; Tsuij, H.; Ishikawa, J.: Thin Solid Films 288 (1996) 300.10.1016/S0040-6090(96)08828-1Suche in Google Scholar
9 Karpenko, O.P.; Bilello, J.C.; Yalisove, S.M.: J. Appl. Phys. 82 (1997) 1397.10.1063/1.365916Suche in Google Scholar
10 Gilmer, G.H.; Huang, H.; Roland, C.: Comp. Mater. Sci. 12 (1998) 354.10.1016/S0927-0256(98)00022-6Suche in Google Scholar
11 Srolovitz, D.J.; Mazor, A.; Bukiet, B.G.: J. Vac. Sci. Technol. A 6 (1988) 2371.10.1116/1.575558Suche in Google Scholar
12 Kim, M.H.; Park, T.S.; Lee, D.-S.; Yoon, E.; Park, D.-Y.;Woo, H.-J.; Chun, D.-I.; Ha, J.: J. Mater. Res. 14 (1999) 634.10.1557/JMR.1999.0641Suche in Google Scholar
13 Greiser, J.; Müller, D; Müllner, P.; Thompson, C.V.; Arzt, E.: Scripta Mater. 41 (1999) 709.10.1016/S1359-6462(99)00205-5Suche in Google Scholar
14 Kimura, A.; Birnbaum, H.K.: Scripta Metall. 21 (1987) 219.10.1016/0036-9748(87)90438-8Suche in Google Scholar
15 Bricknell; R.H., Woodford, D.A.: Metal Sci. 18 (1984) 265.10.1179/030634584790420087Suche in Google Scholar
16 Gottstein, G., Shvindlerman, L. S.: Grain Boundary Migration in Metals, CRC Series in Materials Science and Technology, CRC Press, London (1999).Suche in Google Scholar
17 Horton, D.; Thomson, C.B.; Randle, V.: Mater. Sci. Eng. A 203 (1995) 408.10.1016/0921-5093(95)09821-6Suche in Google Scholar
18 Thompson, C.V; Carel, R.: J. Mech. Phys. Solids 44 (1996) 657.10.1016/0022-5096(96)00022-1Suche in Google Scholar
19 Floro, J.A.; Thompson, C.V.; Carel, R.; Bristowe, P.D.: J. Mater. Res. 9 (1994) 2411.10.1557/JMR.1994.2411Suche in Google Scholar
20 Wagner, T.: J. Mater. Res. 13 (1998) 693.10.1557/JMR.1998.0087Suche in Google Scholar
21 Rodríquez, A.M.; Bozzolo, G.; Ferrante, J.: Surf. Sci. 289 (1993) 100.10.1016/0039-6028(93)90891-MSuche in Google Scholar
22 Nix, W.D.: Metall. Trans. A 20 (1989) 2217.10.1007/BF02666659Suche in Google Scholar
23 Klerk, J.d.; Mugrave, J.P. : Proc. Phys. Soc. Lond. B 68 (1955) 81.10.1088/0370-1301/68/2/303Suche in Google Scholar
25 Touloukian, Y.S., Thermophysical Properties of Matter, Thermal Expansion, Vol. 12, Plenum Press, New York (1975).Suche in Google Scholar
26 Cuomo, J.J.; Rossnagel, S.M.: Handbook of Ion Beam Process Technology, Noyes Publications, Park Ridge (1989).Suche in Google Scholar
27 Fukai, Y: The Metal –Hydrogen System, Springer, Berlin (1993).10.1007/978-3-662-02801-8Suche in Google Scholar
28 Stafford, S.W.; McLellan, R.B.: Acta Metall. 12 (1974) 1463.10.1016/0001-6160(74)90107-2Suche in Google Scholar
© 2002 Carl Hanser Verlag, München
Artikel in diesem Heft
- Frontmatter
- Editorial
- Editorial
- Max-Planck-Institut für Metallforschung
- Articles/Aufsätze
- Towards a micromechanical understanding of biological surface devices
- Solid state phase transformation kinetics: a modular transformation model
- Electronic structure investigations of Ni and Cr films on (100)SrTiO3 substrates using electron energy-loss spectroscopy
- Surface magnetization reversal of sputtered CrO2
- Magnetic imaging with full-field soft X-ray microscopy
- Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity
- Fatigue behavior of polycrystalline thin copper films
- Grain growth in magnetron-sputtered nickel films
- Thin Pd films on SrTiO3 (001) substrates: ab initio local-density-functional theory
- Coupled grain boundary and surface diffusion in a polycrystalline thin film constrained by substrate
- Gallium segregation at grain boundaries in aluminium
- Current work at the Stuttgart UHV diffusion bonding facility
- Bonding between Cu and α-Al2O3
- Compressive deformation of niobium sandwich-bonded to alumina
- SiO2-coated carbon nanotubes: theory and experiment
- Simulation of solidification structures of binary alloys
- Gaseous nitriding of iron-chromium alloys
- Deposition of ceramic materials from aqueous solution induced by organic templates
- Notifications/Mitteilungen
- Personen
- Books
- Information
- DGM Further Training
Artikel in diesem Heft
- Frontmatter
- Editorial
- Editorial
- Max-Planck-Institut für Metallforschung
- Articles/Aufsätze
- Towards a micromechanical understanding of biological surface devices
- Solid state phase transformation kinetics: a modular transformation model
- Electronic structure investigations of Ni and Cr films on (100)SrTiO3 substrates using electron energy-loss spectroscopy
- Surface magnetization reversal of sputtered CrO2
- Magnetic imaging with full-field soft X-ray microscopy
- Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity
- Fatigue behavior of polycrystalline thin copper films
- Grain growth in magnetron-sputtered nickel films
- Thin Pd films on SrTiO3 (001) substrates: ab initio local-density-functional theory
- Coupled grain boundary and surface diffusion in a polycrystalline thin film constrained by substrate
- Gallium segregation at grain boundaries in aluminium
- Current work at the Stuttgart UHV diffusion bonding facility
- Bonding between Cu and α-Al2O3
- Compressive deformation of niobium sandwich-bonded to alumina
- SiO2-coated carbon nanotubes: theory and experiment
- Simulation of solidification structures of binary alloys
- Gaseous nitriding of iron-chromium alloys
- Deposition of ceramic materials from aqueous solution induced by organic templates
- Notifications/Mitteilungen
- Personen
- Books
- Information
- DGM Further Training