Contents
- Contents/Inhalt
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Requires Authentication UnlicensedInhalt / ContentsLicensedMay 5, 2013
- Technical Contributions/Fachbeiträge
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Requires Authentication UnlicensedMetallographic Characterization of Additive-Layer Manufactured Products by Electron Beam Melting of Ti-6Al-4V PowderLicensedMay 5, 2013
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Requires Authentication UnlicensedA Comparison of Grain Quantitative Evaluation Performed with Standard Method of Imaging with Light Microscopy and EBSD AnalysisLicensedMay 5, 2013
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Requires Authentication UnlicensedImplications of EBSD-based Grain Size Measurement on Structure-Property CorrelationsLicensedMay 5, 2013
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Requires Authentication UnlicensedCo-site Microscopy: Case StudiesLicensedMay 5, 2013