Contents
            - Contents/Inhalt
 - 
    Requires Authentication UnlicensedInhalt / ContentsLicensedMay 5, 2013
 - Technical Contributions/Fachbeiträge
 - 
    Requires Authentication UnlicensedMetallographic Characterization of Additive-Layer Manufactured Products by Electron Beam Melting of Ti-6Al-4V PowderLicensedMay 5, 2013
 - 
    Requires Authentication UnlicensedA Comparison of Grain Quantitative Evaluation Performed with Standard Method of Imaging with Light Microscopy and EBSD AnalysisLicensedMay 5, 2013
 - 
    Requires Authentication UnlicensedImplications of EBSD-based Grain Size Measurement on Structure-Property CorrelationsLicensedMay 5, 2013
 - 
    Requires Authentication UnlicensedCo-site Microscopy: Case StudiesLicensedMay 5, 2013