Metallographic Characterization of Additive-Layer Manufactured Products by Electron Beam Melting of Ti-6Al-4V Powder
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Lawrence E. Murr
Abstract
Optical metallography and electron metallography (SEM and TEM) techniques are applied to the characterization of additive-layer manufactured products and prototypes by electron beam melting (EBM) of Ti-6Al-4V atomized precursor powder. In addition, microstructure-property comparisons are made by hardness and tensile test measurements which demonstrate prospects for controlled property-performance variations by varying process parameters including temperature profiles and cooling rates in manufactured prototypes.
Kurzfassung
Verfahren wie optische Metallographie und Elektronenmetallographie (REM und TEM) werden für die Charakterisierung von Halbzeugen mit Additivschichten und Prototypen durch Elektronenstrahlschmelzen (EBM) aus verdüstem Ti-6Al-4V-Ausgangspulver angewendet. Zusätzlich wurden Vergleiche der Gefügeeigenschaften durch Härte- und Dehnungsmessungen durchgeführt, die Aussichten für kontrollierte Varianten des Eigenschafts-Nutzeffekts durch Veränderung von Prozessparametern einschließlich Temperaturprofilen und Kühlraten in den hergestellten Prototypen zeigen.
References/Literatur
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© 2009, Carl Hanser Verlag, München
Artikel in diesem Heft
- Contents/Inhalt
- Inhalt / Contents
- Technical Contributions/Fachbeiträge
- Metallographic Characterization of Additive-Layer Manufactured Products by Electron Beam Melting of Ti-6Al-4V Powder
- A Comparison of Grain Quantitative Evaluation Performed with Standard Method of Imaging with Light Microscopy and EBSD Analysis
- Implications of EBSD-based Grain Size Measurement on Structure-Property Correlations
- Co-site Microscopy: Case Studies
Artikel in diesem Heft
- Contents/Inhalt
- Inhalt / Contents
- Technical Contributions/Fachbeiträge
- Metallographic Characterization of Additive-Layer Manufactured Products by Electron Beam Melting of Ti-6Al-4V Powder
- A Comparison of Grain Quantitative Evaluation Performed with Standard Method of Imaging with Light Microscopy and EBSD Analysis
- Implications of EBSD-based Grain Size Measurement on Structure-Property Correlations
- Co-site Microscopy: Case Studies