Abstract
During transmission electron microscopy (TEM) investigations of Al alloys, defects caused by the electron irradiation can occur. Since the image contrast of these irradiation defects is similar to that of early stages of precipitates, care is needed to avoid confusion. In the present paper the formation and the coarsening of radiation damage defects were studied by in situ TEM in both, pure Al and Al alloys. High-resolution (HR)TEM images show on an atomic level that the radiation defects are extrinsic Frank loops (some converted into unfaulted prismatic loops); they are distributed homogeneously within the TEM foil but inhomogeneously on the four {111} planes. Applying HRTEM imaging conditions, the minimum electron energy causing defects is found to be as low as 110 keV using a [110] beam direction. The results for pure Al are very similar to those of the Al alloys. Therefore, during HRTEM studies (using accelerating voltages > 100 kV) the formation of radiation defects seems inevitable; they can be distinguished from the early stages of precipitates if they lie on different planes.
Dedicated to Professor Dr. Knut Urban on the occasion of his 65th birthday
Funding statement: Financial support from the ‘Austrian FWF’ is gratefully acknowledged
References
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© 2006 Carl Hanser Verlag, München
Artikel in diesem Heft
- Frontmatter
- Editorial
- Professor Dr. Knut Urban 65 Years
- Basic
- Ordering processes and atomic defects in FeCo
- Atomic resolution electron tomography: a dream?
- Electron tomography of microelectronic device interconnects
- Aberration correction in electron microscopy
- Off-axis electron holography: Materials analysis at atomic resolution
- Determination of phases of complex scattering amplitudes and two-particle structure factors by investigating diffractograms of thin amorphous foils
- Prospects of the multislice method for CBED pattern calculation
- Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis
- Quantitative assessment of nanoparticle size distributions from HRTEM images
- Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide
- Structural domains in antiferromagnetic LaFeO3 thin films
- Short-range order of liquid Ti72.3Fe27.7 investigated by a combination of neutron scattering and X-ray diffraction
- Extended interfacial structure between two asymmetrical facets of a Σ = 9 grain boundary in copper
- Dislocation imaging in fcc colloidal single crystals
- Applied
- Omega phase transformation – morphologies and mechanisms
- Mixed (Sr1 − xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques
- Wetting of aluminium-based complex metallic alloys
- Annealing-induced phase transitions in a Zr–Ti–Nb–Cu–Ni–Al bulk metallic glass matrix composite containing quasicrystalline precipitates
- Special planar defects in the structural complex metallic alloys of Al–Pd–Mn and Al–Ni–Rh
- On the formation of Si nanowires by molecular beam epitaxy
- Self-induced oscillations in Si and other semiconductors
- Growth, interface structure, and magnetic properties of Fe/GaAs and Fe3Si/GaAs hybrid systems
- An investigation of improved titanium/titanium nitride barriers for submicron aluminum-filled contacts by energy-filtered transmission electron microscopy
- Radiation damage during HRTEM studies in pure Al and Al alloys
- Cross-sectional high-resolution transmission electron microscopy at Mo/Si multilayer stacks
- Structural properties of the fiber –matrix interface in carbon-fiber/carbon-matrix composites and interfaces between carbon layers and planar substrates
- Microstructure and properties of surface-treated Timetal 834
- Notifications
- Personal
- Conferences
Artikel in diesem Heft
- Frontmatter
- Editorial
- Professor Dr. Knut Urban 65 Years
- Basic
- Ordering processes and atomic defects in FeCo
- Atomic resolution electron tomography: a dream?
- Electron tomography of microelectronic device interconnects
- Aberration correction in electron microscopy
- Off-axis electron holography: Materials analysis at atomic resolution
- Determination of phases of complex scattering amplitudes and two-particle structure factors by investigating diffractograms of thin amorphous foils
- Prospects of the multislice method for CBED pattern calculation
- Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis
- Quantitative assessment of nanoparticle size distributions from HRTEM images
- Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide
- Structural domains in antiferromagnetic LaFeO3 thin films
- Short-range order of liquid Ti72.3Fe27.7 investigated by a combination of neutron scattering and X-ray diffraction
- Extended interfacial structure between two asymmetrical facets of a Σ = 9 grain boundary in copper
- Dislocation imaging in fcc colloidal single crystals
- Applied
- Omega phase transformation – morphologies and mechanisms
- Mixed (Sr1 − xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques
- Wetting of aluminium-based complex metallic alloys
- Annealing-induced phase transitions in a Zr–Ti–Nb–Cu–Ni–Al bulk metallic glass matrix composite containing quasicrystalline precipitates
- Special planar defects in the structural complex metallic alloys of Al–Pd–Mn and Al–Ni–Rh
- On the formation of Si nanowires by molecular beam epitaxy
- Self-induced oscillations in Si and other semiconductors
- Growth, interface structure, and magnetic properties of Fe/GaAs and Fe3Si/GaAs hybrid systems
- An investigation of improved titanium/titanium nitride barriers for submicron aluminum-filled contacts by energy-filtered transmission electron microscopy
- Radiation damage during HRTEM studies in pure Al and Al alloys
- Cross-sectional high-resolution transmission electron microscopy at Mo/Si multilayer stacks
- Structural properties of the fiber –matrix interface in carbon-fiber/carbon-matrix composites and interfaces between carbon layers and planar substrates
- Microstructure and properties of surface-treated Timetal 834
- Notifications
- Personal
- Conferences