Home Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis
Article
Licensed
Unlicensed Requires Authentication

Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis

  • P. Schattschneider EMAIL logo , C. Hébert and M. Stöger-Pollach
Published/Copyright: February 12, 2022
Become an author with De Gruyter Brill
Author Information
International Journal of Materials Research
From the journal International Journal of Materials Research Volume 97 Issue 7

Abstract

The established technique of electron energy-loss spectrometry (EELS) in the electron microscope has surpassed the task of chemical microanalysis. Some aspects of EELS, such as low energy losses for optical studies, have a long tradition and we see them re-emerge after a long period of oblivion. Other aspects such as coherence of inelastically scattered electrons are now much better understood and can be used to advantage. Many applications of EELS can and will profit from the enormous progress in instrumentation and computing capacity. In this paper we discuss some unconventional examples of EELS beyond chemical microanalysis.

Keywords: Inelastic electron scattering; Energy loss spectrometry; EELS; XMCD; ELNES

Dedicated to Professor Dr. Knut Urban on the occasion of his 65th birthday

Prof. P. Schattschneider Institut für Festkörperphysik, Technische Universität Wien A-1040 Wien, Austria Tel.: +43 1 588 011 3722 Fax: +43 1 588 011 3899

Funding statement: P.S. and C.H. acknowledge the financial support of the European Commission, contract number 508971 (CHIRALTEM). The contributions of T. Galek, M. Hölzl, M. Nelhiebel, S. Rubino, M. Schenner and many others are gratefully acknowledged

References

[1] G. Leithäuser: Ann. Physik 15 (1904) 283.10.1002/andp.19043201203Search in Google Scholar

[2] G. Ruthemann: Die Naturwissensch. 29 (1941) 648.10.1007/BF01485870Search in Google Scholar

[3] D. Bohm, D. Pines: Phys. Rev. 82 (1951) 625.10.1103/PhysRev.82.625Search in Google Scholar

[4] J. Lindhard: Danske Vidensk. Sensk. Mat.-Fys. Medd. 28 (1954) 1.Search in Google Scholar

[5] P. Nozieres, D. Pines: Phys. Rev. 113 (1959) 1254.10.1103/PhysRev.113.1254Search in Google Scholar

[6] H. Raether: Springer Tracts 88, Springer Berlin (1980).Search in Google Scholar

[7] C. Chen, J. Silcox, R. Vincent: Phys. rev. B 12 (1975) 64.10.1103/PhysRevB.12.64Search in Google Scholar

[8] P. Colliex, B. Jouffrey: Phil. Mag. 25 (1972) 491.10.1080/14786437208226818Search in Google Scholar

[9] R. Cook, S. Cundy: Phil. Mag. 20 (1969) 665.10.1080/14786436908228035Search in Google Scholar

[10] K. Zeppenfeld: Z. Physik 243 (1971) 229.10.1007/BF01394853Search in Google Scholar

[11] E. Kröger: Z. Physik 216 (1968) 115.10.1007/BF01390952Search in Google Scholar

[12] J. Daniels: Z. Physik 203 (1967) 235.10.1007/BF01325915Search in Google Scholar

[13] J. Daniels, P. Krüger: Phys. Stat. Sol. (b) 43 /1971) 659.10.1002/pssb.2220430226Search in Google Scholar

[14] J. Daniels: Opt. commun. 3 (1971) 13.10.1016/0030-4018(71)90201-XSearch in Google Scholar

[15] C. Wehenkel: J. de Phys. 36 (1975) 199.10.1051/jphys:01975003602019900Search in Google Scholar

[16] G. Ruthemann: Ann. d. Phys. 6 (1948) 135.10.1002/andp.19484370303Search in Google Scholar

[17] L. Marton, L. Leder: Phys. Rev. 94 (1954) 203.10.1103/PhysRev.94.203Search in Google Scholar

[18] R. Crick, D. Misell: J. Physics C 4 (1971) 763.10.1080/14786437108216986Search in Google Scholar

[19] M. Isaacson, D. Johnson: Ultramicroscopy 1 (1975) 33.10.1016/S0304-3991(75)80006-4Search in Google Scholar

[20] H. Bethe: Ann. Phys. 5 (1930) 325.10.1002/andp.19303970303Search in Google Scholar

[21] GATAN Inc., EELS Analysis User Guide (2003).Search in Google Scholar

[22] R.F. Egerton: Electron Energy Loss Spectroscopy in the electron microscope (Plenum Press, 1986).10.1007/978-1-4615-6887-2_1Search in Google Scholar

[23] F. Hofer: Ultramicrosc. 21 (1987) 63.10.1016/0304-3991(87)90007-6Search in Google Scholar

[24] O. Krivanek, C. Mory, M. Tencé, C. Colliex: Microsc. Microanal Microstruct. 2 (1991) 257.10.1051/mmm:0199100202-3025700Search in Google Scholar

[25] R. Vanfleet, D. Muller, H. Gossmann, P. Citrin, J. Silcox, in: Proc. Symp. Mat. Res. Soc. Proc. (2001) 173– 178.Search in Google Scholar

[26] P.E. Batson: Proc. EDGE2005, Int. EELS Workshop (2005) 4.Search in Google Scholar

[27] M. Varela, S.D. Findlay, A.R. Lupini, H.M. Christen, A.Y. Borisevich, N. Dellby, O.L. Krivanek, P.D. Neilist, M.P. Oxley, L.J. Allen, S.J. Pennycook: Phys. Rev. Lett. 92 (2004) 095502.10.1103/PhysRevLett.92.095502Search in Google Scholar

[28] P. Schattschneider, C. Hebert, H. Franco, B. Jouffrey: Phys. Rev. B 72 (2005) 045142.10.1103/PhysRevB.72.045142Search in Google Scholar

[29] H. Yoshioka: J. Phys. Soc. of Japan 12 (1957) 618.10.1143/JPSJ.12.618Search in Google Scholar

[30] H. Rose: Optik 45 (1976) 139.10.2307/43628192Search in Google Scholar

[31] H. Rose: Optik 45 (1976) 187.10.2307/43628199Search in Google Scholar

[32] H. Kohl, H. Rose: Adv. electronics and electron phys. 65 (1985) 173.10.1016/S0065-2539(08)60878-1Search in Google Scholar

[33] S. Dudarev, M. Ryazanov: Acta Cryst. A 44 (1988) 51.10.1107/S0108767387008389Search in Google Scholar

[34] T. Josefsson, L. Allen, P. Miller, C. Rossouw: Phys. Rev. 50 (1994) 6673.10.1103/PhysRevB.50.6673Search in Google Scholar PubMed

[35] L. Allen, T. Josefsson: Phys. Rev. 53 (1996) 11285.10.1103/PhysRevB.53.11285Search in Google Scholar PubMed

[36] V.W. Maslen, C.J. Rossouw: Phil. Mag. A 47 (1983) 119.10.1080/01418618308243112Search in Google Scholar

[37] P. Crozier: Philos. Mag. B 61 (1990) 311.10.1080/13642819008208637Search in Google Scholar

[38] S.L. Dudarev, L.M. Peng, M.J. Whelan: Phys. Rev. B 48 (1993) 13408.10.1103/PhysRevB.48.13408Search in Google Scholar PubMed

[39] M. Nelhiebel, M. Schenner, P. Schattschneider: Ultramicroscopy 66 (1996) 173.10.1016/S0304-3991(96)00085-XSearch in Google Scholar

[40] P. Schattschneider, M. Nelhiebel, M. Schenner, W. Grogger, F. Hofer: Journal of Microscopy 183 (1996) 18.10.1046/j.1365-2818.1996.73076.xSearch in Google Scholar

[41] M. Schenner, M. Nelhiebel, P. Schattschneider: Ultramicroscopy 65 (1996) 95.10.1016/S0304-3991(96)00062-9Search in Google Scholar

[42] M. Nelhiebel, P.H. Louf, P. Schattschneider, P. Blaha, K. Schwarz, B. Jouffrey: Phys. Rev. B 59 (1999) 12807.10.1103/PhysRevB.59.12807Search in Google Scholar

[43] P. Schattschneider, M. Nelhiebel, B. Jouffrey: Phys. Rev. B 59 (1999) 10959.10.1103/PhysRevB.59.10959Search in Google Scholar

[44] P. Schattschneider, M. Nelhiebel, H. Souchay, B. Jouffrey: Micron 31 (2000) 333.10.1016/S0968-4328(99)00112-2Search in Google Scholar

[45] J. Tafto, O.L. Krivanek: Nucl. Instrum. Methods 194 (1982) 153.10.1016/0029-554X(82)90508-0Search in Google Scholar

[46] W. Nüchter, W. Sigle: Philos. Mag. A 71 (1995) 165.10.1080/01418619508242963Search in Google Scholar

[47] C. Prietzel, H. Kohl: Micoscopy and Microanal. (2003) 88.10.1017/S1431927603013229Search in Google Scholar

[48] M. Nelhiebel, P. Schattschneider, B. Jouffrey: Phys. Rev. Lett. 85 (2000) 1847.10.1103/PhysRevLett.85.1847Search in Google Scholar PubMed

[49] S. Rubino, P. Schattschneider, C. Hébert, P.A. van Aken: Proc. EDGE2005, Int. EELS Workshop (2005) 73.Search in Google Scholar

[50] P.A. van Aken, S. Rubino, P. Schattschneider, C. Hébert: Proc. EDGE2005, Int. EELS Workshop (2005) 109.Search in Google Scholar

[51] P. Schattschneider, C. Hébert, S. Rubino, J. Rusz, J. Kunes, P. Novak, E. Carlino, M. Fabrizioli, G. Panaccione, G. Rossi: Nature 441 (2006) 486.10.1038/nature04778Search in Google Scholar

[52] J. Stöhr, H.A. Padmore, S. Anders, T. Stammler, M.R. Scheinfein: Surface Review and Letters 5 (1998) 1297.10.1142/S0218625X98001638Search in Google Scholar

[53] J. Stöhr: Journal of Magnetism and Magnetic Materials 200 (1999) 470.10.1016/S0304-8853(99)00407-2Search in Google Scholar

[54] L. Reimer: Adv. Electronics Electr. Phys. 81 (1991) 43.10.1016/S0065-2539(08)60863-XSearch in Google Scholar

[55] P. Schattschneider, B. Jouffrey, in: L. Reimer (Ed.): Energy-Filtering Transmission Electron Microscopy, Springer (1995) 151.10.1007/978-3-540-48995-5_3Search in Google Scholar

[56] R.H. Ritchie: Phsy. Rev. 106 (1957) 874.10.1103/PhysRev.106.874Search in Google Scholar

[57] R. Egerton: Electron Energy Loss Spectroscopy in the Electron Microscope, 2nd Ed. (Plenum Press, New York, London, 1996).10.1007/978-1-4757-5099-7Search in Google Scholar

[58] J. Daniels, C. von Festenberg, H. Raether, K. Zeppenfeld: Springer Tracts in Modern Physics 54 (1970) 78.Search in Google Scholar

[59] P. Drude: Phys. Z. 14 (1900) 161.10.5962/bhl.part.11528Search in Google Scholar

[60] M. Stöger-Pollach, H. Franco, P. Schattschneider, S. Lazar, B. Schaffer, W. Grogger, H.W. Zandbergen: Micron 37, doi 10.1016/J. Micron. 2006.01.001.10.1016/J. Micron. 2006.01.001Search in Google Scholar

[61] P. Ehrenreich: IEEE Spectrum 2 (1965) 162.10.1109/MSPEC.1965.5531773Search in Google Scholar

[62] P. Schattschneider: Fundamentals of inelastic electron scattering (Springer, Wien, New York, 1986).10.1007/978-3-7091-8866-8Search in Google Scholar

[63] F. Hofer, P. Golob: Micron Microsc. Acta 19 (1988) 73.10.1016/0739-6260(88)90002-0Search in Google Scholar

[64] Y. Kainuma: Acta Cryst. 8 (1955) 247.10.1107/S0365110X55000832Search in Google Scholar

[65] J. Gjønnes: Acta Crys. 20 (1966) 240.10.1107/S0365110X66000471Search in Google Scholar

[66] P. Rez, C. Humphreys, M. Whelan: Phil. Mag. 35 (1977) 81.10.1080/14786437708235974Search in Google Scholar

[67] F. Chukhovskii, L. Alexanjan, Z. Pinsker: Acta Crys. A 29 (1973) 38.10.1107/S0567739473000094Search in Google Scholar

[68] L.J. Allen: Ultramicroscopy 48 (1993) 97.10.1016/0304-3991(93)90175-WSearch in Google Scholar

[69] S. Takagi: J. Phys. Soc. of Japan 13 (1958) 278.10.1143/JPSJ.13.278Search in Google Scholar

[70] S. Takagi: J. Phys. Soc. Japan 13 (1958) 287.10.1143/JPSJ.13.287Search in Google Scholar

[71] C. Rossouw: Ultramicroscopy 16 (1985) 241.10.1016/0304-3991(85)90078-6Search in Google Scholar

[72] Z. Wang: Elastic and inelastic scattering in electron diffraction and imaging (Plenum, New York, 1995).10.1007/978-1-4899-1579-5Search in Google Scholar

[73] C. Rossouw, M. Whelan: Ultramicrscopy 6 (1981) 53.10.1016/S0304-3991(81)80177-5Search in Google Scholar

[74] W. Coene, D. van Dyke: Ultramicroscopy 33 (1990) 261.10.1016/0304-3991(90)90043-LSearch in Google Scholar

[75] A. Weickenmeier, H. Kohl: Phil. Mag. B 60 (1989) 467.10.1080/13642818908205920Search in Google Scholar

[76] R. Howie: Proc. Roy. Soc. A 271 (1963) 268.10.1098/rspa.1963.0017Search in Google Scholar

[77] J. Tafto, G. Lehmpfuhl: Ultramicroscopy 7 (1982) 287.10.1016/0304-3991(82)90176-0Search in Google Scholar

[78] J. Tafto, J. Spence: Ultramicroscopy 9 (1982) 243.10.1016/0304-3991(82)90207-8Search in Google Scholar

[79] J. Spence, J. Tafto: J. Micr. 130 (1983) 147.10.1111/j.1365-2818.1983.tb04213.xSearch in Google Scholar

[80] M. Oxley, L. Allen: Phys. Rev. B 57 (1998) 3273.10.1103/PhysRevB.57.3273Search in Google Scholar

[81] C.J. Rossouw, S.L. Dudarev, T.W. Josefsso, L.J. Allen: Ultramicroscopy 72 (1998) 17.10.1016/S0304-3991(97)00121-6Search in Google Scholar

[82] O. Krivanek, M. Disko, J. Tafto, J. Spence: Ultramicroscopy 9 (1982) 249.10.1016/0304-3991(82)90208-XSearch in Google Scholar

[83] A.P. Hitchcock: Japanese Journal of Applied Physics 32 suppl 2 (1992) 176.10.7567/JJAPS.32S2.176Search in Google Scholar

[84] J.C. Fuggle, J.E. Inglesfield (Eds.): Unoccupied Electronic States (Springer, Berlin, 1992).10.1007/3-540-54162-4Search in Google Scholar

[85] J. Yuan, N. Menon: J. Appl. Phys. 81 (1997) 5087.10.1063/1.364480Search in Google Scholar

[86] P. van Aken, S. Lauterbach: Phys. and Chem. of Minerals 30 (2003) 469.10.1007/s00269-003-0340-4Search in Google Scholar

[87] C. Hébert, P. Schattschneider: Ultramicroscopy 96 (2003) 463.10.1016/S0304-3991(03)00108-6Search in Google Scholar

[88] J.J. Rehr, R.C. Albers: Review of Modern Physics 72 (2000) 621.10.1103/RevModPhys.72.621Search in Google Scholar

[89] C. Kolczewski, K. Hermann: Surface Science 552 (2004) 98.10.1016/j.susc.2004.01.013Search in Google Scholar

[90] P. Blaha, K. Schwarz, G. Madsen, D. Kvasicka, J. Luitz: WIEN2k, An Augmented Plane Wave + Local Orbital Program for Calculating Crystal Properties (Karlheinz Schwarz, Techn. Universität Wien, Austria, 2001).Search in Google Scholar

[91] D.A. Muller, D.J. Singh, J. Silcox: Phys. Rev. B 57 (1998) 8181.10.1103/PhysRevB.57.8181Search in Google Scholar

[92] D. Muller: Phys. Rev. B 58 (1998) 5989.10.1103/PhysRevB.58.5989Search in Google Scholar

[93] C. Hébert, J. Luitz, P. Schattschneider: Micron 34 (2003) 219.10.1016/S0968-4328(03)00030-1Search in Google Scholar

[94] C. Hébert, S. Clair, C. Eisenmenger-Sittner, H. Bangert, B. Jouffrey, P. Schattschneider: Journal of Physics, Condensed Matter 13 (2001) 3791.10.1088/0953-8984/13/16/309Search in Google Scholar

[95] D.A. Pankhurst, G.A. Botton, C.J. Humphreys: Phys. Rev. B 63 (2001) 205117.10.1103/PhysRevB.63.205117Search in Google Scholar

[96] J.T. Titantah, D. Lamoen: Phys. Rev. B 70 (2004) 075115.10.1103/PhysRevB.70.075115Search in Google Scholar
Received: 2006-01-25
Accepted: 2006-05-02
Published Online: 2022-02-12

© 2006 Carl Hanser Verlag, München

Articles in the same Issue

  1. Frontmatter
  2. Editorial
  3. Professor Dr. Knut Urban 65 Years
  4. Basic
  5. Ordering processes and atomic defects in FeCo
  6. Atomic resolution electron tomography: a dream?
  7. Electron tomography of microelectronic device interconnects
  8. Aberration correction in electron microscopy
  9. Off-axis electron holography: Materials analysis at atomic resolution
  10. Determination of phases of complex scattering amplitudes and two-particle structure factors by investigating diffractograms of thin amorphous foils
  11. Prospects of the multislice method for CBED pattern calculation
  12. Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis
  13. Quantitative assessment of nanoparticle size distributions from HRTEM images
  14. Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide
  15. Structural domains in antiferromagnetic LaFeO3 thin films
  16. Short-range order of liquid Ti72.3Fe27.7 investigated by a combination of neutron scattering and X-ray diffraction
  17. Extended interfacial structure between two asymmetrical facets of a Σ = 9 grain boundary in copper
  18. Dislocation imaging in fcc colloidal single crystals
  19. Applied
  20. Omega phase transformation – morphologies and mechanisms
  21. Mixed (Sr1 − xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques
  22. Wetting of aluminium-based complex metallic alloys
  23. Annealing-induced phase transitions in a Zr–Ti–Nb–Cu–Ni–Al bulk metallic glass matrix composite containing quasicrystalline precipitates
  24. Special planar defects in the structural complex metallic alloys of Al–Pd–Mn and Al–Ni–Rh
  25. On the formation of Si nanowires by molecular beam epitaxy
  26. Self-induced oscillations in Si and other semiconductors
  27. Growth, interface structure, and magnetic properties of Fe/GaAs and Fe3Si/GaAs hybrid systems
  28. An investigation of improved titanium/titanium nitride barriers for submicron aluminum-filled contacts by energy-filtered transmission electron microscopy
  29. Radiation damage during HRTEM studies in pure Al and Al alloys
  30. Cross-sectional high-resolution transmission electron microscopy at Mo/Si multilayer stacks
  31. Structural properties of the fiber –matrix interface in carbon-fiber/carbon-matrix composites and interfaces between carbon layers and planar substrates
  32. Microstructure and properties of surface-treated Timetal 834
  33. Notifications
  34. Personal
  35. Conferences
https://doi.org/10.1515/ijmr-2006-0147
Keywords for this article
Inelastic electron scattering; Energy loss spectrometry; EELS; XMCD; ELNES

Articles in the same Issue

  1. Frontmatter
  2. Editorial
  3. Professor Dr. Knut Urban 65 Years
  4. Basic
  5. Ordering processes and atomic defects in FeCo
  6. Atomic resolution electron tomography: a dream?
  7. Electron tomography of microelectronic device interconnects
  8. Aberration correction in electron microscopy
  9. Off-axis electron holography: Materials analysis at atomic resolution
  10. Determination of phases of complex scattering amplitudes and two-particle structure factors by investigating diffractograms of thin amorphous foils
  11. Prospects of the multislice method for CBED pattern calculation
  12. Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis
  13. Quantitative assessment of nanoparticle size distributions from HRTEM images
  14. Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide
  15. Structural domains in antiferromagnetic LaFeO3 thin films
  16. Short-range order of liquid Ti72.3Fe27.7 investigated by a combination of neutron scattering and X-ray diffraction
  17. Extended interfacial structure between two asymmetrical facets of a Σ = 9 grain boundary in copper
  18. Dislocation imaging in fcc colloidal single crystals
  19. Applied
  20. Omega phase transformation – morphologies and mechanisms
  21. Mixed (Sr1 − xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques
  22. Wetting of aluminium-based complex metallic alloys
  23. Annealing-induced phase transitions in a Zr–Ti–Nb–Cu–Ni–Al bulk metallic glass matrix composite containing quasicrystalline precipitates
  24. Special planar defects in the structural complex metallic alloys of Al–Pd–Mn and Al–Ni–Rh
  25. On the formation of Si nanowires by molecular beam epitaxy
  26. Self-induced oscillations in Si and other semiconductors
  27. Growth, interface structure, and magnetic properties of Fe/GaAs and Fe3Si/GaAs hybrid systems
  28. An investigation of improved titanium/titanium nitride barriers for submicron aluminum-filled contacts by energy-filtered transmission electron microscopy
  29. Radiation damage during HRTEM studies in pure Al and Al alloys
  30. Cross-sectional high-resolution transmission electron microscopy at Mo/Si multilayer stacks
  31. Structural properties of the fiber –matrix interface in carbon-fiber/carbon-matrix composites and interfaces between carbon layers and planar substrates
  32. Microstructure and properties of surface-treated Timetal 834
  33. Notifications
  34. Personal
  35. Conferences
Sign up now to receive a 20% welcome discount
Institutional Access
How does access work?
Have an idea on how to improve our website?
Please write us.
© 2025 De Gruyter Brill
Downloaded on 20.9.2025 from https://www.degruyterbrill.com/document/doi/10.1515/ijmr-2006-0147/html
Scroll to top button