Atomic resolution electron tomography: a dream?
-
Dirk Van Dyck
,
Sandra Van Aert
Abstract
In this paper, the possibilities and intrinsic physical limits to atomic resolution electron tomography are discussed. It is shown that atomic resolution electron tomography is in principle possible and may provide atom position coordinates with sufficient precision to use as input data for theoretical ab-initio calculations. For amorphous materials which are subject to radiation damage it may require a lower voltage and the use of a Cs and Cc corrector. For perfect crystalline samples the projected structure can be reconstructed from exit waves using the channeling theory. Combining the reconstructions obtained from different zone axis orientations then yields the 3D atomic structure. The most difficult objects will be semicrystalline materials where strong dynamic scattering interferes with weak signals from the aperiodicity. Here we suggest to use a new technique called precession laminography. Finally, doubt is raised about the practical usability of optical sectioning by HAADF STEM.
Dedicated to Professor Dr. Knut Urban on the occasion of his 65th birthday
Funding statement: The authors gratefully acknowledge the financial support of the Fund for Scientific Research-Flanders (FWO)
References
[1] R. Henderson: Quarterly Reviews of Biophysics 28 (1995) 171.10.1017/S003358350000305XSuche in Google Scholar
[2] P.A. Midgley, J.M. Thomas, L. Laffont, M. Weyland, R. Raja, B.F.G. Johnson, T. Khimyak: Journal of Physical Chemistry B 108 (2004) 4590.10.1021/jp049750bSuche in Google Scholar
[3] P.A. Midgley, M. Weyland: Ultramicroscopy 96 (2003) 413.10.1016/S0304-3991(03)00105-0Suche in Google Scholar
[4] U. Ziese, K.P. de Jong, A.J. Koster: Applied Catalysis A – General 260 (2004) 71.10.1016/j.apcata.2003.10.014Suche in Google Scholar
[5] C. Kubel, A. Voigt, R. Schoenmakers, M. Otten, D. Su, T.C. Lee, A. Carlsson, J. Bradley: Microscopy and Microanalysis 11 (2005) 378.10.1017/S1431927605050361Suche in Google Scholar
[6] E. Philp, J. Sloan, A.I. Kirkland, R.R. Meyer, S. Friedrichs, J.L. Hutchison, M.L.H. Green: Nature Materials 2 (2003) 788.10.1038/nmat1020Suche in Google Scholar
[7] W.M.J. Coene, A. Thust, M. Op de Beeck, D. Van Dyck: Ultramicroscopy 64 (1996) 109.10.1016/0304-3991(96)00010-1Suche in Google Scholar
[8] H. Rose: Optik 85 (1990) 19.10.1002/pauz.19900190221Suche in Google Scholar
[9] D. Van Dyck, S. Van Aert, A.J. den Dekker, A. van den Bos: Ultramicroscopy 98 (2003) 27.10.1016/S0304-3991(03)00023-8Suche in Google Scholar
[10] D. Van Dyck, A.F. de Jong: Ultramicroscopy 47 (1992) 266.10.1016/0304-3991(92)90202-USuche in Google Scholar
[11] A.C. Kak, M. Slaney: Computerized Tomographic Imaging, IEEE Press, New York (1988).Suche in Google Scholar
[12] P.A. Midgley, M. Weyland: Ultramicroscopy 96 (2002) 413.10.1016/S0304-3991(03)00105-0Suche in Google Scholar
[13] J. Frank: Electron Tomography. Three-dimensional Imaging with the Transmission Electron Microscope, Plenum Press, New York (1992).Suche in Google Scholar
[14] A. van den Bos, A.J. den Dekker: Advances in Imaging and Electron Physics 117 (2001) 241.10.1016/S1076-5670(01)80114-2Suche in Google Scholar
[15] S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck: Advances in Imaging and Electron Physics 130 (2004) 1.10.1016/S1076-5670(04)30001-7Suche in Google Scholar
[16] S. Van Aert, A.J. den Dekker, D. Van Dyck, A. van den Bos: J. Structural Biology 138 (2002) 21.10.1016/S1047-8477(02)00016-3Suche in Google Scholar
[17] D. Van Dyck, M. Op de Beeck: Ultramicroscopy 64 (1996) 99.10.1016/0304-3991(96)00008-3Suche in Google Scholar
[18] S. Van Aert, A.J. den Dekker, D. Van Dyck: Micron 35 (2004) 425.10.1016/j.micron.2004.01.007Suche in Google Scholar
[19] D. Van Dyck: Advances in Imaging and Electron Physics 123 (2002) 105.10.1016/S1076-5670(02)80062-3Suche in Google Scholar
[20] W. Röntgen: Sitzungsber. der Würzburger Physik-Mediz. Gesellschaft (1895) 132.Suche in Google Scholar
[21] E. Pohl: Swiss patent no. 155613, 30 June 1930.Suche in Google Scholar
[22] B. Ziedses des Plantes: Acta Radio. 13 (1932) 182.10.3109/00016923209135135Suche in Google Scholar
[23] http://lca.kaist.ac.kr/Researches/2000/pcbtomo.htmlSuche in Google Scholar
[24] A.Y. Borisevich, A.R. Lupini, S.J. Pennycook: Proceedings of the National Academy of Sciences of the United States of America 103 (2006) 3044.10.1073/pnas.0507105103Suche in Google Scholar PubMed PubMed Central
[25] S.J. Pennycook, M. Varela, C.J.D. Hetherington: MRS Bulletin 31 (2006) 36.10.1557/mrs2006.4Suche in Google Scholar
© 2006 Carl Hanser Verlag, München
Artikel in diesem Heft
- Frontmatter
- Editorial
- Professor Dr. Knut Urban 65 Years
- Basic
- Ordering processes and atomic defects in FeCo
- Atomic resolution electron tomography: a dream?
- Electron tomography of microelectronic device interconnects
- Aberration correction in electron microscopy
- Off-axis electron holography: Materials analysis at atomic resolution
- Determination of phases of complex scattering amplitudes and two-particle structure factors by investigating diffractograms of thin amorphous foils
- Prospects of the multislice method for CBED pattern calculation
- Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis
- Quantitative assessment of nanoparticle size distributions from HRTEM images
- Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide
- Structural domains in antiferromagnetic LaFeO3 thin films
- Short-range order of liquid Ti72.3Fe27.7 investigated by a combination of neutron scattering and X-ray diffraction
- Extended interfacial structure between two asymmetrical facets of a Σ = 9 grain boundary in copper
- Dislocation imaging in fcc colloidal single crystals
- Applied
- Omega phase transformation – morphologies and mechanisms
- Mixed (Sr1 − xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques
- Wetting of aluminium-based complex metallic alloys
- Annealing-induced phase transitions in a Zr–Ti–Nb–Cu–Ni–Al bulk metallic glass matrix composite containing quasicrystalline precipitates
- Special planar defects in the structural complex metallic alloys of Al–Pd–Mn and Al–Ni–Rh
- On the formation of Si nanowires by molecular beam epitaxy
- Self-induced oscillations in Si and other semiconductors
- Growth, interface structure, and magnetic properties of Fe/GaAs and Fe3Si/GaAs hybrid systems
- An investigation of improved titanium/titanium nitride barriers for submicron aluminum-filled contacts by energy-filtered transmission electron microscopy
- Radiation damage during HRTEM studies in pure Al and Al alloys
- Cross-sectional high-resolution transmission electron microscopy at Mo/Si multilayer stacks
- Structural properties of the fiber –matrix interface in carbon-fiber/carbon-matrix composites and interfaces between carbon layers and planar substrates
- Microstructure and properties of surface-treated Timetal 834
- Notifications
- Personal
- Conferences
Artikel in diesem Heft
- Frontmatter
- Editorial
- Professor Dr. Knut Urban 65 Years
- Basic
- Ordering processes and atomic defects in FeCo
- Atomic resolution electron tomography: a dream?
- Electron tomography of microelectronic device interconnects
- Aberration correction in electron microscopy
- Off-axis electron holography: Materials analysis at atomic resolution
- Determination of phases of complex scattering amplitudes and two-particle structure factors by investigating diffractograms of thin amorphous foils
- Prospects of the multislice method for CBED pattern calculation
- Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis
- Quantitative assessment of nanoparticle size distributions from HRTEM images
- Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide
- Structural domains in antiferromagnetic LaFeO3 thin films
- Short-range order of liquid Ti72.3Fe27.7 investigated by a combination of neutron scattering and X-ray diffraction
- Extended interfacial structure between two asymmetrical facets of a Σ = 9 grain boundary in copper
- Dislocation imaging in fcc colloidal single crystals
- Applied
- Omega phase transformation – morphologies and mechanisms
- Mixed (Sr1 − xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques
- Wetting of aluminium-based complex metallic alloys
- Annealing-induced phase transitions in a Zr–Ti–Nb–Cu–Ni–Al bulk metallic glass matrix composite containing quasicrystalline precipitates
- Special planar defects in the structural complex metallic alloys of Al–Pd–Mn and Al–Ni–Rh
- On the formation of Si nanowires by molecular beam epitaxy
- Self-induced oscillations in Si and other semiconductors
- Growth, interface structure, and magnetic properties of Fe/GaAs and Fe3Si/GaAs hybrid systems
- An investigation of improved titanium/titanium nitride barriers for submicron aluminum-filled contacts by energy-filtered transmission electron microscopy
- Radiation damage during HRTEM studies in pure Al and Al alloys
- Cross-sectional high-resolution transmission electron microscopy at Mo/Si multilayer stacks
- Structural properties of the fiber –matrix interface in carbon-fiber/carbon-matrix composites and interfaces between carbon layers and planar substrates
- Microstructure and properties of surface-treated Timetal 834
- Notifications
- Personal
- Conferences
