Direct measurement of nanoindentation area function by metrological AFM
-
G. Aldrich-Smith
,
N. M. Jennett
Abstract
Both the hardness and modulus values obtained by nanoindentation depend on knowledge of the area of contact between the test material and the indenter. Significant errors can be introduced into the measurement if the projected area of the indentation contact is not known with sufficient accuracy. The state-of-the-art for user validation of indenter area function is to use materials of known Young’s modulus in the ‘two reference materials method’. However, the area function is best measured directly by traceably calibrated metrological atomic force microscopy. An area function for a standard Hysitron indenter was generated, using both atomic force microscopy and indentation. The results are compared, and the effect of data fitting techniques and measurement uncertainty are discussed.
References
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© 2005 Carl Hanser Verlag, München
Artikel in diesem Heft
- Frontmatter
- Editorial
- nanomech 5
- Articles Basic
- Quantitative evaluation of nanoindents: Do we need more reliable mechanical parameters for the characterization of materials?
- Nanoindentation investigation of solid-solution strengthening in III-V semiconductor alloys
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- Obtaining mechanical parameters for metallisation stress sensor design using nanoindentation
- Direct measurement of nanoindentation area function by metrological AFM
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- Analysis of the ductile/brittle transition during a scratch test performed into polymeric film deposited on a PMMA substrate
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- Notifications/Mitteilungen
- Personal/Personelles
- Press/Presse
Artikel in diesem Heft
- Frontmatter
- Editorial
- nanomech 5
- Articles Basic
- Quantitative evaluation of nanoindents: Do we need more reliable mechanical parameters for the characterization of materials?
- Nanoindentation investigation of solid-solution strengthening in III-V semiconductor alloys
- Comparison between conventional Vickers hardness and indentation hardness obtained with different instruments
- On the pressure dependence of the indentation modulus
- A review on the reverse analysis for the extraction of mechanical properties using instrumented Vickers indentation
- Articles Applied
- Quasi-static and dynamic depth-sensing indentation measurements to characterize wear and mar resistance of coating–polymer systems
- Obtaining mechanical parameters for metallisation stress sensor design using nanoindentation
- Direct measurement of nanoindentation area function by metrological AFM
- A usable concept for the indentation of thin porous films
- Analysis of the ductile/brittle transition during a scratch test performed into polymeric film deposited on a PMMA substrate
- Nanomechanical and nanotribological properties of polymeric ultrathin films for nanoimprint lithography
- Adhesive and nanomechanical properties of polymeric films deposited on silicon
- Modelling of the nanoindentation process of ultrathin films
- Regular articles
- Experimental investigation and thermodynamic calculation in the Al–Be–Si ternary system
- Thermodynamic assessment of the Ca–Sn system
- Interfacial reaction between Cu and Ti2SnC during processing of Cu–Ti2SnC composite
- Effects of heat treatment on the lubricated sliding wear behaviour of zinc-based alloy containing nickel under varying test conditions
- Influence of Ce, K, and Na on spheroidization of eutectic carbides in low-tungsten white cast iron
- Notifications/Mitteilungen
- Personal/Personelles
- Press/Presse
