Startseite Technik In-situ high temperature microstructural analysis during tempering of 42CrMo4 using transmission electron microscopy
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In-situ high temperature microstructural analysis during tempering of 42CrMo4 using transmission electron microscopy

  • Christian Krause , Ronald Springer , Gregory Gershteyn , Wlodzimierz Dudzinski und Friedrich-Wilhelm Bach
Veröffentlicht/Copyright: 11. Juni 2013
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Abstract

In the present work, investigations of the microstructural changes were carried out during hardening and tempering of 42CrMo4 (1.7225) steel. Using transmission electron microscopy, the hardened state was examined initially. Following this, the material was incrementally heated in a heated specimen holder to 580 °C. Diffraction patterns were recorded at regular intervals in order to analyse and document the changes from a martensitic structure to a ferritic structure. The characteristic tempering stages were identified for the material and assigned to a temperature range. Moreover, thermal activated diffusion processes were detected above 500 °C.


* Correspondence address, Dr.-Ing. Christian Krause, eldec Schwenk Induction GmbH, Otto-Hahn-Straße 14, D-72280 Dornstetten, Germany, Tel.: +49 7443 9649 73, Fax: +49 7443 9649 31, E-mail:

References

[1] U.Ahrens, G.Besserdich, H.-J.Maier: Härterei Technische Mitteilungen HTM55 (2000) 6, Carl Hanser Verlag München, 329338.Suche in Google Scholar

[2] W.Crafts; J.L.Lamont: Härtbarkeit und Auswahl von Stählen, Springer Verlag, Berlin (1954).10.1007/978-3-642-92619-8Suche in Google Scholar

[3] W.Bleck (Ed.): Werkstoffkunde Stahl für Studium und Praxis, Wissenschaftsverlag, Aachen (2004).Suche in Google Scholar

[4] W.Dahl (Ed.): Eigenschaften und Anwendung der Stähle, Verlag der Augustinus Buchhandlung, Aachen (1998).Suche in Google Scholar

[5] H.-J.Eckstein: Wärmebehandlung von Stahl, VEB Deutscher Verlag für Grundstoffindustrie, Leipzig (1969).Suche in Google Scholar

[6] E.P.Butler: Rep. Prog. Phys.42 (1979) 833889.10.1088/0034-4885/42/5/002Suche in Google Scholar

[7] T.Kamino, K.Sasaki, H.Saka: Microsc. Microanal.3 (1997) 393408.10.1017/S143192769797029XSuche in Google Scholar

[8] R.Sinclair, T.Itoh, R.Chin: Microsc. Microanal.8 (2002) 288304.10.1017/S1431927602020226Suche in Google Scholar

[9] M.Gojic, L.Kosec, P.Matkovic: J. Mater. Sci.33 (1998) 395403.10.1023/A:1004375914591Suche in Google Scholar

[10] K.Sawada, M.Taneike, K.Kimura, F.Abe: Mater. Sci. Technol.19 (2003) 739742.10.1179/026708303225010696Suche in Google Scholar

[11] Y.Iguchi, T.Kouda, T.Shibata: ISIJ International44 (2004) 243249.10.2355/isijinternational.44.243Suche in Google Scholar

[12] J.Liu, C.P.Luo: Mater. Sci. Eng. A438 (2006) 153157.10.1016/j.msea.2005.12.047Suche in Google Scholar

[13] D.B.Williams, C.B.Carter: Transmission Electron Microscopy II Diffraction, Springer Science + Buiseness Media, Inc. (2006).Suche in Google Scholar

[14] H.Schuhmann, H.Oettel (Eds.): Metallografie, Wiley-VCH Verlag, Weinheim (2005).Suche in Google Scholar

[15] J.M.Beswick: Metall. Trans. A18 (1987) 18971906.10.1007/BF02647019Suche in Google Scholar

Received: 2008-2-26
Accepted: 2009-4-30
Published Online: 2013-06-11
Published in Print: 2009-07-01

© 2009, Carl Hanser Verlag, München

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