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Volume 3, Issue 5-6 - Green Photonics / Guest Editors: Andreas Tünnermann, Kimio Tatsuno
Contents
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Publicly AvailableCover and FrontmatterDecember 18, 2014
- Views
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November 14, 2014
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Publicly AvailableLasers in Green Production: The best is yet to comeDecember 18, 2014
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Publicly AvailableFrom LED to laser fusion: Green Photonics in a US perspectiveDecember 18, 2014
- Community
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Publicly AvailableNews from the European Optical SocietyDecember 18, 2014
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Publicly AvailableConference NotesDecember 18, 2014
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Publicly AvailableConference CalendarDecember 18, 2014
- Topical Issue: Green Photonics
- Editorial
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Publicly AvailableGreen photonics: sustainable solutions for a future with lightDecember 18, 2014
- Topical Issue: Green Photonics
- Review Articles
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Requires Authentication UnlicensedInterferometric femtosecond laser processing for nanostructuring inside thin filmLicensedDecember 18, 2014
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Requires Authentication UnlicensedMultilayer-based lab-on-a-chip systems for perfused cell-based assaysLicensedDecember 18, 2014
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Requires Authentication UnlicensedSystem efficiency of laser-based white lightLicensedDecember 18, 2014
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Requires Authentication UnlicensedLow-power consumption seamless wireless and wired links using transparent waveform transferLicensedDecember 18, 2014
- Topical Issue: Green Photonics
- Research Articles
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Requires Authentication UnlicensedFemtosecond laser full and partial texturing of steel surfaces to reduce friction in lubricated contactLicensedDecember 18, 2014
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Requires Authentication UnlicensedMulti-pass absorption spectroscopy for H2O2 detection using a CW DFB-QCLLicensedDecember 18, 2014
Issues in this Volume
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Issue 5-6Green Photonics / Guest Editors: Andreas Tünnermann, Kimio Tatsuno
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Issue 4Optical metrology for precision engineering / Guest Editors: Wei Gao, Bernd Bodermann
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Issue 3
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Issue 2Active Imaging / Guest Editors: Martin Laurenzis and Hans Dieter Tholl
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Issue 1Optical Coatings / Guest Editors: Norbert Kaiser, Xu Liu and Angus Macleod
Issues in this Volume
-
Issue 5-6Green Photonics / Guest Editors: Andreas Tünnermann, Kimio Tatsuno
-
Issue 4Optical metrology for precision engineering / Guest Editors: Wei Gao, Bernd Bodermann
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Issue 3
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Issue 2Active Imaging / Guest Editors: Martin Laurenzis and Hans Dieter Tholl
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Issue 1Optical Coatings / Guest Editors: Norbert Kaiser, Xu Liu and Angus Macleod