Consumption of Cu pad during multiple reflows of Ni-doped SnAgCu solder
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C. C. Chang
, S. C. Yang , Y. J. Chen and C. R. Kao
Abstract
The effects of solder volume and the number of reflows on the Cu consumption rate were studied. Nickel-doped Sn3Ag0.5Cu0.02Ni solder balls of different diameters (300, 400, 600 and 760 μm in diameter) were reflowed over Cu soldering pads with an opening of 600 μm in diameter. The reflow profile had a peak temperature of 235 ± 2°C and a 90 s duration during which the solder was molten. The nominal ramp rate and cooling rate were both 1.5 K s−1. The first reflow consumed the largest amount of Cu, and the subsequent reflows only consumed marginally more Cu. It was argued that the solder joints became saturated with Cu during the first reflow so that during the subsequent reflows the Cu substrates were consumed at markedly reduced rates. The Cu consumption increased with the diameter of the solder balls. This was because a larger amount of Cu was needed in order to saturate a solder joint with a larger solder volume. The doping of Ni did not change the Cu consumption rate despite the fact that the amount of Cu6Sn5 at the interface increased substantially with Ni doping.
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- Alloying effect on microstructure and mechanical properties of thermomechanically processed Ni3(Si,Ti) alloys
- Contents
- Contents
- Original Contributions
- Neuro-finite element application in material characterization using small punch test
- Multi-phase biocomposite material in-situ fabricated by using hydroxyapatite and amorphous nanosilica
- Particularities of the formations of bainite and martensite/austenite phase in low carbon low alloy steels during continuous cooling
- Texture analysis of polymer modified bitumen images
- Influence of nitridation time on microstructure, morphology and optical properties of GaN nanowires by nitridizing Ga2O3/Cr thin films
- Deformation behaviour of freestanding single-crystalline Ni3Al-based nanoparticles
- Precipitation strengthening in high manganese austenitic TWIP steels
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- Professor Dr.-Ing. Jürgen Haußelt zum 65. Geburtstag
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