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A new method to measure monoclinic depth profile in zirconia-based ceramics from X-ray diffraction data

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Published/Copyright: June 11, 2013

Abstract

In this paper a method to evaluate monoclinic fraction depth profile in zirconia, based on X-ray diffraction at grazing angles, is proposed. The necessary mathematical developments are exposed. The method is numerically tested in different theoretical configurations, and then on zirconia-toughened alumina and on alumina-toughened zirconia. The results show that it is possible to follow both surface fraction and thickness of the monoclinic layer, within the penetration depth of the X-rays. This is a considerable improvement over simple X-ray diffraction measurements. However, its accuracy is limited for high depth, but considerably improved as compared to previous methods.


* Correspondence address Dr. Laurent Gremillard, MATEIS, Bât. Blaise Pascal, INSA-Lyon, 20 avenue Albert Einstein, 69621 Villeurbanne Cedex, FRANCE. Tel.: +33 4 72 43 81 52, Fax: +33 4 72 43 85 28, E-mail:

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Received: 2009-3-30
Accepted: 2009-10-26
Published Online: 2013-06-11
Published in Print: 2010-01-01

© 2010, Carl Hanser Verlag, München

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