A new method to measure monoclinic depth profile in zirconia-based ceramics from X-ray diffraction data
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Abstract
In this paper a method to evaluate monoclinic fraction depth profile in zirconia, based on X-ray diffraction at grazing angles, is proposed. The necessary mathematical developments are exposed. The method is numerically tested in different theoretical configurations, and then on zirconia-toughened alumina and on alumina-toughened zirconia. The results show that it is possible to follow both surface fraction and thickness of the monoclinic layer, within the penetration depth of the X-rays. This is a considerable improvement over simple X-ray diffraction measurements. However, its accuracy is limited for high depth, but considerably improved as compared to previous methods.
References
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© 2010, Carl Hanser Verlag, München
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Articles in the same Issue
- Contents
- Contents
- Editorial
- Editorial
- The 7th International Workshop on Interfaces: New Materials via Interfacial Control
- Basic
- First principles based predictions of the toughness of a metal/oxide interface
- The role of interfaces in the behavior of magnetic tunnel junction structures
- Applications of aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy to thin oxide films and interfaces
- Van der Waals-London dispersion interaction framework for experimentally realistic carbon nanotube systems
- Determination of grain boundary potentials in ceramics: Combining impedance spectroscopy and inline electron holography
- Grain boundary plane distributions in aluminas evolving by normal and abnormal grain growth and displaying different complexions
- Theoretical study on the structure and energetics of intergranular glassy film in Si3N4-SiO2 ceramics
- Inter-granular glassy phases in the low-CaO-doped HIPed Si3N4 ceramics: a review
- Applied
- Sintering of fully faceted crystalline particles
- Grain growth kinetics and segregation in yttria tetragonal zirconia polycrystals
- A new method to measure monoclinic depth profile in zirconia-based ceramics from X-ray diffraction data
- The role of Si impurities in the transient dopant segregation and precipitation in yttrium-doped alumina
- Using microfabricated devices to determine the fracture strength of materials
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