Polymeric structures at interfaces: An X-ray scattering study
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Panteleimon Panagiotou
Abstract
X-ray scattering based on synchrotron radiation enables the detection of polymeric structures at interfaces despite the weak contrast between adjacent polymers build-up from different monomeric units. Variable types of polymeric structures result from typical pattern directing mechanisms, such as dewetting in case of homopolymer films, phase separation in polymer blend films, micro-phase separation in diblock copolymer films and surface enrichment in statistical copolymer films. The pattern directing mechanisms introduce structures ordered perpendicular and parallel to the polymeric surface. Consequently, specular and off-specular X-ray scattering is applied as demonstrated within examples. From scattering the characteristic structures which are not accessible by means of other techniques are determined. Limitations with respect to isolated objects such as holes are discussed.
© 2004 Oldenbourg Wissenschaftsverlag GmbH
Artikel in diesem Heft
- Editorial: Structure Analysis of Thin Films and Nanostructures
- High resolution X-ray diffraction of MOVPE-grown ZnO/GaN/sapphire layers
- Exact determination of Indium incorporation in (InxGa1–xN/GaN)-multiple quantum well structures by X-ray diffraction and -reflectivity and its impact on optical properties
- Annealing studies of high Ge composition Si/SiGe multilayers
- Lateral periodicity of elastic domains in MnAs/GaAs(001) epitaxial layers studied by high resolution X-ray diffraction
- X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films
- Polymeric structures at interfaces: An X-ray scattering study
- X-ray and VIS light scattering from light-induced polymer gratings
- Imaging plates – a new life for electron diffraction structure analysis
- On the superstructure of KTiO2(OH)
- Molecular and crystal structure of Ac-(Z)-ΔAbu-NMe2 and Ac-DL-Abu-NMe2 as compared to those of related molecules
- J-aggregate structures in crystals of three bisazomethine dyes
- Books Received
Artikel in diesem Heft
- Editorial: Structure Analysis of Thin Films and Nanostructures
- High resolution X-ray diffraction of MOVPE-grown ZnO/GaN/sapphire layers
- Exact determination of Indium incorporation in (InxGa1–xN/GaN)-multiple quantum well structures by X-ray diffraction and -reflectivity and its impact on optical properties
- Annealing studies of high Ge composition Si/SiGe multilayers
- Lateral periodicity of elastic domains in MnAs/GaAs(001) epitaxial layers studied by high resolution X-ray diffraction
- X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films
- Polymeric structures at interfaces: An X-ray scattering study
- X-ray and VIS light scattering from light-induced polymer gratings
- Imaging plates – a new life for electron diffraction structure analysis
- On the superstructure of KTiO2(OH)
- Molecular and crystal structure of Ac-(Z)-ΔAbu-NMe2 and Ac-DL-Abu-NMe2 as compared to those of related molecules
- J-aggregate structures in crystals of three bisazomethine dyes
- Books Received
