Article
Licensed
Unlicensed
Requires Authentication
X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films
-
Robert Fendt
Published/Copyright:
September 25, 2009
Abstract
We report on X-ray reflectivity experiments of thin liquid heptane films. The films were examined using X-ray reflectivity and modelled both as a layered system using the Parratt algorithm and using a ´phase guessing´ inversion method. Our results combined with simulations of films of shrinking thickness show that small temperature instabilities during the investigation can cause artifacts in the electron density profile. These can easily be mistaken for density os cillations near the interface as might be expected for liquid molecules near a hard wall.
:
Published Online: 2009-9-25
Published in Print: 2004-4-1
© 2004 Oldenbourg Wissenschaftsverlag GmbH
You are currently not able to access this content.
You are currently not able to access this content.
Articles in the same Issue
- Editorial: Structure Analysis of Thin Films and Nanostructures
- High resolution X-ray diffraction of MOVPE-grown ZnO/GaN/sapphire layers
- Exact determination of Indium incorporation in (InxGa1–xN/GaN)-multiple quantum well structures by X-ray diffraction and -reflectivity and its impact on optical properties
- Annealing studies of high Ge composition Si/SiGe multilayers
- Lateral periodicity of elastic domains in MnAs/GaAs(001) epitaxial layers studied by high resolution X-ray diffraction
- X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films
- Polymeric structures at interfaces: An X-ray scattering study
- X-ray and VIS light scattering from light-induced polymer gratings
- Imaging plates – a new life for electron diffraction structure analysis
- On the superstructure of KTiO2(OH)
- Molecular and crystal structure of Ac-(Z)-ΔAbu-NMe2 and Ac-DL-Abu-NMe2 as compared to those of related molecules
- J-aggregate structures in crystals of three bisazomethine dyes
- Books Received
Articles in the same Issue
- Editorial: Structure Analysis of Thin Films and Nanostructures
- High resolution X-ray diffraction of MOVPE-grown ZnO/GaN/sapphire layers
- Exact determination of Indium incorporation in (InxGa1–xN/GaN)-multiple quantum well structures by X-ray diffraction and -reflectivity and its impact on optical properties
- Annealing studies of high Ge composition Si/SiGe multilayers
- Lateral periodicity of elastic domains in MnAs/GaAs(001) epitaxial layers studied by high resolution X-ray diffraction
- X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films
- Polymeric structures at interfaces: An X-ray scattering study
- X-ray and VIS light scattering from light-induced polymer gratings
- Imaging plates – a new life for electron diffraction structure analysis
- On the superstructure of KTiO2(OH)
- Molecular and crystal structure of Ac-(Z)-ΔAbu-NMe2 and Ac-DL-Abu-NMe2 as compared to those of related molecules
- J-aggregate structures in crystals of three bisazomethine dyes
- Books Received
