Editorial: Structure Analysis of Thin Films and Nanostructures

Articles in the same Issue

1. Editorial: Structure Analysis of Thin Films and Nanostructures
2. High resolution X-ray diffraction of MOVPE-grown ZnO/GaN/sapphire layers
3. Exact determination of Indium incorporation in (In_xGa_1–xN/GaN)-multiple quantum well structures by X-ray diffraction and -reflectivity and its impact on optical properties
4. Annealing studies of high Ge composition Si/SiGe multilayers
5. Lateral periodicity of elastic domains in MnAs/GaAs(001) epitaxial layers studied by high resolution X-ray diffraction
6. X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films
7. Polymeric structures at interfaces: An X-ray scattering study
8. X-ray and VIS light scattering from light-induced polymer gratings
9. Imaging plates – a new life for electron diffraction structure analysis
10. On the superstructure of KTiO₂(OH)
11. Molecular and crystal structure of Ac-(Z)-ΔAbu-NMe₂ and Ac-DL-Abu-NMe₂ as compared to those of related molecules
12. J-aggregate structures in crystals of three bisazomethine dyes
13. Books Received