An analytic and generalized formulation of the sin2 ψ-method
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Balder Ortner
Abstract
X-ray stress measurements can be done without the accurate knowledge of the unstressed lattice parameters, if the specimen’s surface can be assumed as stress-free and provided that the measured strains depend linearly on sin2 ψ. This is usually done in the so-called sin2 ψ method. An analytical formalism is proposed with which the same task can be performed even if the linear sin2 ψ dependence is not given. Therefore, one is completely free in choosing and combining measurement parameters φ;ψ, and (hkl). It can be used for single-crystalline, textured, texture-free, isotropic or anisotropic materials. Further advantages are an easy way for correct error calculus and a means to optimize the whole procedure for minimum errors in φ.
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© 2005 Carl Hanser Verlag, München
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- Frontmatter
- Kösterpreis
- Award/Preisverleihung
- Editorial
- Editorial
- Articles Basic
- Effect of interface strength on electromigration-induced inlaid copper interconnect degradation: Experiment and simulation
- Application of factor analysis in electron spectrometry (AES, XPS) for materials science
- Focussing and defocussing effects at radio frequency glow discharge optical emission spectroscopy analyses of thin films with partly nonconductive components
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- A comparison of thermal stability in nanocrystalline Ni- and Co-based materials
- Microstructure and phase formation of Heusler thin film compounds
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- Modeling of axial strain in free-end torsion of textured copper
- Vacancies in plastically deformed copper
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- Nanoindentation applied on a tungsten–copper composite before and after high-pressure torsion
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