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An analytic and generalized formulation of the sin2 ψ-method

  • Balder Ortner
Published/Copyright: February 16, 2022
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Abstract

X-ray stress measurements can be done without the accurate knowledge of the unstressed lattice parameters, if the specimen’s surface can be assumed as stress-free and provided that the measured strains depend linearly on sin2 ψ. This is usually done in the so-called sin2 ψ method. An analytical formalism is proposed with which the same task can be performed even if the linear sin2 ψ dependence is not given. Therefore, one is completely free in choosing and combining measurement parameters φ;ψ, and (hkl). It can be used for single-crystalline, textured, texture-free, isotropic or anisotropic materials. Further advantages are an easy way for correct error calculus and a means to optimize the whole procedure for minimum errors in φ.


Ao Univ. Prof. Dr. Balder Ortner Institut für Materialphysik, Montanuniversität Leoben Jahnstr. 12, A-8700 Leoben, Austria Tel.: +43 3842 804 315 Fax: +43 3842 804 116

Dedicated to Professor Dr. Dr. h. c. Hein Peter Stüwe on the occasion of his 75th birthday


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Received: 2005-04-04
Accepted: 2005-06-15
Published Online: 2022-02-16

© 2005 Carl Hanser Verlag, München

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