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Beyond grayscale lithography: inherently three-dimensional patterning by Talbot effect

  • Roberto Fallica ORCID logo EMAIL logo
Published/Copyright: May 23, 2019
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Abstract

There are a growing number of applications where three-dimensional patterning is needed for the fabrication of micro- and nanostructures. Thus far, grayscale lithography is the main technique for obtaining a thickness gradient in a resist material that is exploited for pattern transfer by anisotropic etch. However, truly three-dimensional structures can only be produced by unconventional lithography methods such as direct laser writing, focused ion beam electrodeposition, colloidal sphere lithography, and tilted multiple-pass projection lithography, but at the cost of remarkable complexity and lengthiness. In this work, the three-dimensional shape of light, which is formed by Talbot effect diffraction, was exploited to produce inherently three-dimensional patterns in a photosensitive polymer. Using light in the soft X-ray wavelength, periodic three-dimensional structures of lateral period 600 nm were obtained. The position at which the sample has to be located to be in the Fresnel regime was simulated using an analytical implementation of the Fresnel integrals approach. Exploiting the light shape forming in diffraction effects thus enables the patterning of high-resolution three-dimensional nanostructures over a large area and with a single exposure pass – which would be otherwise impossible with conventional lithographic methods.

Acknowledgments

The contributions of Michaela Vockenhuber, Markus Kropf, and Iacopo Mochi (Paul Scherrer Institute) are kindly acknowledged. Part of this work was performed at the Swiss Light Source of the Paul Scherrer Institute.

References

[1] T. Dillon, M. Zablocki, J. Murakowski and D. Prather, Proc. SPIE 6923, 69233B (2008).Search in Google Scholar

[2] J. Vila-Comamala, S. Gorelick, V. A. Guzenko and C. David, J. Vacuum Sci. Technol. B 29, 06F301 (2011).10.1116/1.3629811Search in Google Scholar

[3] J. Atencia, S. Barnes, J. Douglas, M. Meacham and L. E. Locascio, Lab Chip 7, 1567 (2007).10.1039/b709369aSearch in Google Scholar

[4] R. Fallica, R. Kirchner, H. Schift and Y. Ekinci, Microelectr. Eng. 177, 1 (2017)10.1016/j.mee.2017.01.007Search in Google Scholar

[5] C. M. Waits, B. Morgan, M. Kastantin and R. Ghodssi, Sens. Actuators A 119, 245 (2005).10.1016/S0924-4247(04)00193-1Search in Google Scholar

[6] P. P. Naulleau, J. A. Liddle, F. Salmassi, E. H. Anderson and E. M. Gullikson, Appl. Opt. 43, 5323 (2004).10.1364/AO.43.005323Search in Google Scholar

[7] R. Kirchner, V. A. Guzenko, M. Rohn, E. Sonntag, M. Mühlberger, et al., Microelectron. Eng. 141, 107 (2015).10.1016/j.mee.2015.02.014Search in Google Scholar

[8] H. Mekaru, Micromachines 6, 252 (2015).10.3390/mi6020252Search in Google Scholar

[9] S. Hirscher, R. Kaesmaier, W. -D. Domke, A. Wolter, H. Loeschner, et al., Microelectron. Eng. 57, 517 (2001).10.1016/S0167-9317(01)00543-3Search in Google Scholar

[10] C. Kaspar, J. Butschke, M. Irmscher, S. Martens, H. Sailer, et al., J. Vacuum Sci. Technol. B 35, 06G501 (2017).10.1116/1.4993724Search in Google Scholar

[11] M. Deubel, G. von Freymann, M. Wegener, S. Pereira, K. Busch, et al., Nat. Mater. 3, 444 (2004).10.1038/nmat1155Search in Google Scholar PubMed

[12] G. Seniutinas, A. Balčytis, I. Reklaitis, F. Chen, J. Davis, et al., Nanophotonics 6, 923 (2017)10.1515/nanoph-2017-0008Search in Google Scholar

[13] Y. A. Vlasov, X. -Z. Bo, J. C. Sturm and D. J. Norris, Nature 414, 289 (2001).10.1038/35104529Search in Google Scholar PubMed

[14] Y. Matsubara, J. Taniguchi and I. Miyamoto, Jap. J. Appl. Phys. 45, 5538 (2006).10.1143/JJAP.45.5538Search in Google Scholar

[15] J. B. Lee, K. -H. Choi and K. Yoo, Micromachines 6, 1 (2015).10.3390/mi6010001Search in Google Scholar

[16] F. Romanato, L. Businaro, L. Vaccari, S. Cabrini, P. Candeloro, et al., Microelectron. Eng. 479, 67 (2003).10.1016/S0167-9317(03)00104-7Search in Google Scholar

[17] H. Solak, J. Phys. D Appl. Phys. 39, R171 (2006).10.1088/0022-3727/39/10/R01Search in Google Scholar

[18] Y. V. Miklyaev, D. C. Meisel, A. Blanco, G. Freymann, K. Busch, et al., Appl. Phys. Lett. 82, 1284–1286 (2003).10.1063/1.1557328Search in Google Scholar

[19] R. C. Rumpf and E. G. Johnson, J. Opt. Soc. Am. A 21, 1703 (2004).10.1364/JOSAA.21.001703Search in Google Scholar PubMed

[20] H. Kim, S. Danylyuk, W. S. Brocklesby and L. Juschkin, J. Opt. Soc. Korea 20, 245 (2016).10.3807/JOSK.2016.20.2.245Search in Google Scholar

[21] H. Kim, W. Li, S. Danylyuk, W. S. Brocklesby, M. C. Marconi, et al., J. Phys. D Appl. Phys. 48, 375101 (2015).10.1088/0022-3727/48/37/375101Search in Google Scholar

[22] R. M. M. Hasan and X. Luo, Nanomanufact. Metrol. 1, 67 (2018).10.1007/s41871-018-0016-9Search in Google Scholar

[23] H.F. Talbot, Philos. Mag. Ser. 39, 401 (1836).10.1080/14786443608649032Search in Google Scholar

[24] B. Besold and N. Lindlein, Opt. Eng. 36, 1099 (1997).10.1117/1.601301Search in Google Scholar

[25] A. A. Goloborodko, Optik 127, 4478 (2016).10.1016/j.ijleo.2016.01.175Search in Google Scholar

Received: 2019-01-10
Accepted: 2019-04-23
Published Online: 2019-05-23
Published in Print: 2019-06-26

©2019 THOSS Media & De Gruyter, Berlin/Boston

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