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Analytical TEM study of microstructure – property relations in liquid-phase-sintered SiC with AlN–Y2O3 additives

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Veröffentlicht/Copyright: 27. Januar 2022
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International Journal of Materials Research
Aus der Zeitschrift International Journal of Materials Research Band 96 Heft 5

Abstract

The microstructures of liquid-phase sintered SiC with AlN℃Y2O3 additives are systematically investigated by using transmission electron microscopy and analytical electron microscopy. Pure α-SiC as starting powder leads to fine, equiaxied microstructure. Introduction of α-SiC seed crystals into β-SiC powder accelerates the β-to-α-SiC phase transformation through a solution-precipitation process and promotes anisotropic grain growth, which results in a plate-like microstructure. Core/rim structures were found in both cases as a result of AlN dissolution into the re-precipitated part of SiC grains. This changes the liquid composition during sintering and induces crystallization of Y10Al2Si3O18N4 and Y2O3 in the triple-pockets. Amorphous films were observed to wet both grain boundaries and two-phase interfaces. A low ratio of AlN to Y2O3 in the sintering additive accelerates the devitrification of triple-pockets. Additional annealing can further devitrify the triple-pockets as well as the amorphous GB films, leading to a microstructure with potentially higher creep resistance.

Keywords: Liquid-phase sintering; Silicon carbide; Analytical electron microscopy; Intergranular phase; Grain boundary; Solid solution
Prof. Dr. Hui Gu Shanghai Institute of ceramics, Chinese Academy of Sciences 1295 Ding-xi road, Shanghai 200050, China Tel.: +86 21 5241 2318 Fax: +86 21 5241 3122

  1. The authors appreciate the support from the Max Planck Society via the partner group program with the Chinese Academy of Sciences. We would like to thank the technical assistances from Kersten Hahn, Jörg Thomas, Peter Kopold, and Ute Salzberger in TEM experiments and sample preparation.

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Received: 2005-01-03
Accepted: 2005-02-16
Published Online: 2022-01-27

© 2005 Carl Hanser Verlag, München

Artikel in diesem Heft

  1. Frontmatter
  2. Editorial
  3. Editorial
  4. Articles Basic
  5. TEM observations on the behavior of facet junctions in interfaces and inclusions
  6. 1-dimensional lanthanide halide crystals encapsulated within single-walled carbon nanotubes – a brief review
  7. UHV chemical vapour deposition of silicon nanowires
  8. StripeTEM as a method of calculating chemical profiles across interfaces between solids or core-shell structures using electron energy-loss spectroscopic profiling
  9. Nanocluster interfaces and epitaxy: Ag on Si surfaces
  10. Imaging grain boundary segregation by electron diffractive imaging
  11. Interfaces in nanosize perovskite titanate ferroelectrics – microstructure and impact on selected properties
  12. Dynamic observation of nanometer-sized island formation on the SrTiO3(001) and (011) surfaces by in situ high-resolution transmission electron microscopy
  13. Modeling of misfit and threading dislocations in epitaxial heterostructures
  14. Grain growth under the influence of mechanical stresses
  15. Articles Applied
  16. Interfaces in nanostructured thin films and their influence on hardness
  17. The temporal evolution of the nanostructures of model Ni–Al–Cr and Ni–Al–Cr–Re superalloys
  18. Effect of TiO2–SiO2 distribution on bimodal microstructure of TiO2-doped α-Al2O3 ceramics
  19. Understanding nanostructured hard coatings – the importance of interfaces and interphases
  20. Analytical TEM study of microstructure – property relations in liquid-phase-sintered SiC with AlN–Y2O3 additives
  21. Evidence of a transient phase during the hydrolysis of calcium-deficient hydroxyapatite
  22. Zirconia/nickel interfaces in micro- and nanocomposites
  23. Notifications/Mitteilungen
  24. Personal/Personelles
  25. News/Aktuelles
  26. Conferences/Konferenzen
https://doi.org/10.3139/ijmr-2005-0089
Schlagwörter für diesen Artikel
Liquid-phase sintering; Silicon carbide; Analytical electron microscopy; Intergranular phase; Grain boundary; Solid solution

Artikel in diesem Heft

  1. Frontmatter
  2. Editorial
  3. Editorial
  4. Articles Basic
  5. TEM observations on the behavior of facet junctions in interfaces and inclusions
  6. 1-dimensional lanthanide halide crystals encapsulated within single-walled carbon nanotubes – a brief review
  7. UHV chemical vapour deposition of silicon nanowires
  8. StripeTEM as a method of calculating chemical profiles across interfaces between solids or core-shell structures using electron energy-loss spectroscopic profiling
  9. Nanocluster interfaces and epitaxy: Ag on Si surfaces
  10. Imaging grain boundary segregation by electron diffractive imaging
  11. Interfaces in nanosize perovskite titanate ferroelectrics – microstructure and impact on selected properties
  12. Dynamic observation of nanometer-sized island formation on the SrTiO3(001) and (011) surfaces by in situ high-resolution transmission electron microscopy
  13. Modeling of misfit and threading dislocations in epitaxial heterostructures
  14. Grain growth under the influence of mechanical stresses
  15. Articles Applied
  16. Interfaces in nanostructured thin films and their influence on hardness
  17. The temporal evolution of the nanostructures of model Ni–Al–Cr and Ni–Al–Cr–Re superalloys
  18. Effect of TiO2–SiO2 distribution on bimodal microstructure of TiO2-doped α-Al2O3 ceramics
  19. Understanding nanostructured hard coatings – the importance of interfaces and interphases
  20. Analytical TEM study of microstructure – property relations in liquid-phase-sintered SiC with AlN–Y2O3 additives
  21. Evidence of a transient phase during the hydrolysis of calcium-deficient hydroxyapatite
  22. Zirconia/nickel interfaces in micro- and nanocomposites
  23. Notifications/Mitteilungen
  24. Personal/Personelles
  25. News/Aktuelles
  26. Conferences/Konferenzen
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