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StripeTEM as a method of calculating chemical profiles across interfaces between solids or core-shell structures using electron energy-loss spectroscopic profiling

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Veröffentlicht/Copyright: 27. Januar 2022
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International Journal of Materials Research
Aus der Zeitschrift International Journal of Materials Research Band 96 Heft 5

Abstract

Electron energy-loss spectroscopic profiling is a hybrid method between imaging and spectroscopy. It can be applied in a transmission electron microscope with an imaging energy filter operated in spectroscopy mode such that an image is recorded on a two-dimensional detector with an interface parallel to the energy-dispersive direction. This reveals directly, i. e., in one exposure, how a specific energy-loss near-edge structure varies across the interface. The aim of this work is to describe a method called stripeTEM to extract quantitative chemical profiles from spectroscopic imaging, discuss practical implementations, compare the method to more widely used nano-analytical techniques, and to present some recent applications to materials science. Measurements of diffusion and segregation in planar thin films as well as the observation of core-shell structures of nano-particles are reviewed.

Keywords: EFTEM; Analytical TEM; EELS; Interdiffusion; Segregation
Dr. Thomas Walther Center of Advanced European Studies and Research (caesar) Electron Microscopy Ludwig-Erhard-Allee 2, D-53175 Bonn, Germany Tel.: +49 228 9656 198 Fax: +49 228 9656 116

References

[1] J.J. Hren, J.I. Goldstein, D.C. Joy: Introduction to Analytical Electron Microscopy, Plenum Press, New York, 1979. 10.1007/978-1-4757-5581-7Suche in Google Scholar

[2] R.F. Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscope, Plenum Press, New York, 2nd edition, 1996. 10.1007/978-1-4757-5099-7Suche in Google Scholar

[3] H. Shuman, C.F. Chang, A.P. Somlyo: Ultramicroscopy 19 (1986) 121. 10.1016/0304-3991(86)90201-9Suche in Google Scholar

[4] P. Trebbia, C. Mory: Ultramicroscopy 34 (1990) 179. 10.1016/0304-3991(90)90071-SSuche in Google Scholar

[5] B. Nys, W. Jacob, P. van Espen: J. Microsc. 162 (1991) 55. 10.1111/j.1365-2818.1991.tb03115.xSuche in Google Scholar

[6] U.R. Heinrich, H.O. Gutzeit, W. Kreutz: J. Microsc. 162 (1991) 123. 10.1111/j.1365-2818.1991.tb03122.xSuche in Google Scholar

[7] P.A. Crozier: Ultramicroscopy 58 (1995) 157. 10.1016/0304-3991(94)00201-WSuche in Google Scholar

[8] T. Walther, C.J. Humphreys, A.G. Cullis, D.J. Robbins: Mater.Science Forum 196 (1995) 505. 10.4028/www.scientific.net/MSF.196-201.505Suche in Google Scholar

[9] L. Reimer, I. Fromm, P. Hirsch, U. Plate, R. Rennekamp: Ultramicroscopy 46 (1992) 335. 10.1016/0304-3991(92)90023-DSuche in Google Scholar

[10] K. Kimoto, T. Sekiguchi, T. Aoyama: J. Electr. Microsc. 46 (1997)369.10.1093/oxfordjournals.jmicro.a023532Suche in Google Scholar

[11] T. Sekiguchi, K. Kimoto, T. Aoyama, Y. Mitsui: Jpn. J. Appl.Phys. 37 (1998) L694. 10.1143/JJAP.37.L694Suche in Google Scholar

[12] P.L. Flaitz: Inst. Phys. Conf. Ser. 161 (1999) 605. Suche in Google Scholar

[13] T. Walther, W. Mader: Inst. Phys. Conf. Ser. 164 (1999) 121. Suche in Google Scholar

[14] Z.L. Wang, J. Bentley, N.D. Evans: Micron 31 (2000) 355. 10.1016/S0968-4328(99)00114-6Suche in Google Scholar

[15] T. Walther, H. Kalisch, K. Heime, M. Heuken, I. Marko, G.P. Yablonskii: phys. stat. sol. (a) 180 (2000) 351. 10.1002/1521-396X(200007)180:1<351::AID-PSSA351>3.0.CO;2-2Suche in Google Scholar

[16] T. Walther: Physica B 308 (2001) 1161. 10.1016/S0921-4526(01)00933-4Suche in Google Scholar

[17] T. Walther: Ultramicroscopy 96 (2003) 401. 10.1016/S0304-3991(03)00104-9Suche in Google Scholar

[18] U. Golla-Schindler, G. Benner, A. Putnis: Ultramicroscopy 96 (2003) 573. 10.1016/S0304-3991(03)00118-9Suche in Google Scholar

[19] P.E. Batson, K.L. Kavanagh, J.M. Woodall, J.W. Mayer: Phys.Rev. Lett. 57 (1986) 2729. 10.1103/PhysRevLett.57.2729Suche in Google Scholar

[20] J.A. Hunt, D.B. Williams: Ultramicroscopy 38 (1991) 47. 10.1016/0304-3991(91)90108-ISuche in Google Scholar

[21] D.A. Muller: Ultramicroscopy 78 (1999) 163. 10.1016/S0304-3991(99)00029-7Suche in Google Scholar

[22] N.D. Browning, D.J. Wallis, P.D. Nellist, S.J. Pennycook: Micron 28 (1997) 333. 10.1016/S0968-4328(97)00033-4Suche in Google Scholar

[23] T. Walther: Inst. Phys. Conf. Ser. 180 (2003) 27.Suche in Google Scholar

[24] T. Walther, N. Sobal, M. Hilgendorff, M. Giersig: Proc. 15th ICEM 3 (2002) 261.Suche in Google Scholar

[25] T. Walther, C.J. Humphreys, D.J. Robbins: Defect and Diffusion Forum 143–147 (1997) 1135.10.4028/www.scientific.net/DDF.143-147.1135Suche in Google Scholar

[26] Y.H. Liang, J.R. Abelson: J. Vac. Sci. Technol. A 12 (1994) 1099.10.1116/1.579171Suche in Google Scholar

[27] R. Checcheto, L.M. Gratton, A. Miotello, C. Tosello: J. non-cryst. Solids 216 (1997) 65.10.1016/S0022-3093(97)00173-7Suche in Google Scholar

[28] M. Strassburg, M. Kuttler, U.W. Pohl, D. Bimberg: Thin Solid Films 336 (1998) 208.10.1016/S0040-6090(98)01238-3Suche in Google Scholar

[29] S. Mackowski, N.T. Khoi, P. Kossacki, A. Golnik, J.A. Gaj, A. Lemaitre, C. Testelin, C. Rigaux, G. Karczewski, T. Wojtowicz, J. Kossut: J. Cryst. Growth 185 (1998) 966.10.1016/S0022-0248(97)00624-6Suche in Google Scholar

[30] T. Walther: Proc. 15th ICEM 3 (2002) 123.Suche in Google Scholar

[31] J.H. Paterson, O.L. Krivanek: Ultramicroscopy 32 (1990) 319.10.1016/0304-3991(90)90078-ZSuche in Google Scholar

[32] H. Kurata, C. Colliex: Phys. Rev. B 48 (1993) 2102.10.1103/PhysRevB.48.2102Suche in Google Scholar PubMed

[33] D.H. Pearson, C.C. Ahn, B. Fultz: Phys. Rev. B 47 (1993) 8471.10.1103/PhysRevB.47.8471Suche in Google Scholar

[34] J.L. Mansot, P. Leone, P. Euzen, P. Palvadeau: Microsc. Microanal. Microstruct. 5 (1994) 79.10.1051/mmm:019940050207900Suche in Google Scholar

[35] G.A. Botton, C.C. Appel, A. Horsewell, W.M. Stobbs: J. Microsc. 180 (1995) 211.10.1111/j.1365-2818.1995.tb03680.xSuche in Google Scholar

[36] Z.L. Wang, J.S. Yin, Y.D Jiang, J. Zhang: Appl. Phys. Lett. 70 (1997) 3362.10.1063/1.119171Suche in Google Scholar

[37] Z.L. Wang, J.S. Jin, Z.J. Zhang, W.D. Mo: J. Phys. Chem. B 101 (1997) 6793.10.1021/jp971593bSuche in Google Scholar

[38] J. Simon, T. Walther, W. Mader, J. Klein, D. Reisinger, L. Alff, R. Gross: Appl. Phys. Lett. 84 (2004) 3882.10.1063/1.1738930Suche in Google Scholar

[39] M. Giersig, N. Sobal, M. Hilgendorff: Proc. 15th Int. Cong. Electron Microsc. 1 (2002) 295.Suche in Google Scholar

[40] I. Karakaya, W.T. Thompson, in: T.B. Massalski (Ed.), Binary Alloy Phase Diagrams, ASM International, Materials Park, Ohio (1992) 25.Suche in Google Scholar

[41] J. Fink, Th. Müller-Heinzerling, B Scheerer, W. Speier, F.U. Hillebrecht, J.C. Fuggle, J. Zaanen, G.A. Sawatzky: Phys. Rev. B 32 (1985) 4899.10.1103/PhysRevB.32.4899Suche in Google Scholar

[42] W.G. Waddington, P. Rez, I.P. Grant, C.J. Humphreys: Phys. Rev. B 34 (1986) 1467.10.1103/PhysRevB.34.1467Suche in Google Scholar

[43] U. Wiedwald, M. Spasova, E.L. Salabas, M. Ulmeanu, M. Farle, Z. Frait, A.F. Rodriguez, D. Arvanitis, N.S. Sobal, M. Hilgendorff, M. Giersig: Phys. Rev. B 68 (2003) 064424.10.1103/PhysRevB.68.064424Suche in Google Scholar
Received: 2004-08-16
Accepted: 2005-02-09
Published Online: 2022-01-27

© 2005 Carl Hanser Verlag, München

Artikel in diesem Heft

  1. Frontmatter
  2. Editorial
  3. Editorial
  4. Articles Basic
  5. TEM observations on the behavior of facet junctions in interfaces and inclusions
  6. 1-dimensional lanthanide halide crystals encapsulated within single-walled carbon nanotubes – a brief review
  7. UHV chemical vapour deposition of silicon nanowires
  8. StripeTEM as a method of calculating chemical profiles across interfaces between solids or core-shell structures using electron energy-loss spectroscopic profiling
  9. Nanocluster interfaces and epitaxy: Ag on Si surfaces
  10. Imaging grain boundary segregation by electron diffractive imaging
  11. Interfaces in nanosize perovskite titanate ferroelectrics – microstructure and impact on selected properties
  12. Dynamic observation of nanometer-sized island formation on the SrTiO3(001) and (011) surfaces by in situ high-resolution transmission electron microscopy
  13. Modeling of misfit and threading dislocations in epitaxial heterostructures
  14. Grain growth under the influence of mechanical stresses
  15. Articles Applied
  16. Interfaces in nanostructured thin films and their influence on hardness
  17. The temporal evolution of the nanostructures of model Ni–Al–Cr and Ni–Al–Cr–Re superalloys
  18. Effect of TiO2–SiO2 distribution on bimodal microstructure of TiO2-doped α-Al2O3 ceramics
  19. Understanding nanostructured hard coatings – the importance of interfaces and interphases
  20. Analytical TEM study of microstructure – property relations in liquid-phase-sintered SiC with AlN–Y2O3 additives
  21. Evidence of a transient phase during the hydrolysis of calcium-deficient hydroxyapatite
  22. Zirconia/nickel interfaces in micro- and nanocomposites
  23. Notifications/Mitteilungen
  24. Personal/Personelles
  25. News/Aktuelles
  26. Conferences/Konferenzen
https://doi.org/10.3139/ijmr-2005-0078
Schlagwörter für diesen Artikel
EFTEM; Analytical TEM; EELS; Interdiffusion; Segregation

Artikel in diesem Heft

  1. Frontmatter
  2. Editorial
  3. Editorial
  4. Articles Basic
  5. TEM observations on the behavior of facet junctions in interfaces and inclusions
  6. 1-dimensional lanthanide halide crystals encapsulated within single-walled carbon nanotubes – a brief review
  7. UHV chemical vapour deposition of silicon nanowires
  8. StripeTEM as a method of calculating chemical profiles across interfaces between solids or core-shell structures using electron energy-loss spectroscopic profiling
  9. Nanocluster interfaces and epitaxy: Ag on Si surfaces
  10. Imaging grain boundary segregation by electron diffractive imaging
  11. Interfaces in nanosize perovskite titanate ferroelectrics – microstructure and impact on selected properties
  12. Dynamic observation of nanometer-sized island formation on the SrTiO3(001) and (011) surfaces by in situ high-resolution transmission electron microscopy
  13. Modeling of misfit and threading dislocations in epitaxial heterostructures
  14. Grain growth under the influence of mechanical stresses
  15. Articles Applied
  16. Interfaces in nanostructured thin films and their influence on hardness
  17. The temporal evolution of the nanostructures of model Ni–Al–Cr and Ni–Al–Cr–Re superalloys
  18. Effect of TiO2–SiO2 distribution on bimodal microstructure of TiO2-doped α-Al2O3 ceramics
  19. Understanding nanostructured hard coatings – the importance of interfaces and interphases
  20. Analytical TEM study of microstructure – property relations in liquid-phase-sintered SiC with AlN–Y2O3 additives
  21. Evidence of a transient phase during the hydrolysis of calcium-deficient hydroxyapatite
  22. Zirconia/nickel interfaces in micro- and nanocomposites
  23. Notifications/Mitteilungen
  24. Personal/Personelles
  25. News/Aktuelles
  26. Conferences/Konferenzen
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