X-ray stress measurement from an imperfect Debye–Scherrer ring

Toshiyuki Miyazaki; Toshihiko Sasaki

doi:10.3139/146.111179

Article

X-ray stress measurement from an imperfect Debye–Scherrer ring

Toshiyuki Miyazaki and Toshihiko Sasaki

Published/Copyright: March 12, 2015

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From the journal International Journal of Materials Research Volume 106 Issue 3

Abstract

A technique to measure the stress from an imperfect Debye–Scherrer ring is reported. In a previous work, the authors reported a technique to calculate the stress from the Fourier series of a normal strain of a Debye–Scherrer ring and suggested that it is possible to calculate the stress from an imperfect Debye–Scherrer ring if the Fourier series is obtained. The present work presents a technique to calculate the Fourier series of an imperfect Debye–Scherrer ring. Industrially, this is important because the object of interest is often covered by other objects or engraved. The aim of this work is to develop a technique that extends the application range of the X-ray stress measurement.

Keywords: X-ray stress measurement; Debye–Scherrer ring; Fourier series; Inverse problem; Singular value decomposition

* Correspondence address, Toshiyuki Miyazaki, Kanazawa University, Kakuma-machi, Kanazawa, 920-1192, Ishikawa, Japan, Tel.: +81-76-264-5593, Fax: +81-76-264-6039, E-mail: trmiyazaki@staff.kanazawa-u.ac.jp

References

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Received: 2014-09-09

Accepted: 2014-11-05

Published Online: 2015-03-12

Published in Print: 2015-03-11

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Articles in the same Issue

https://doi.org/10.3139/146.111179

Keywords for this article

X-ray stress measurement; Debye–Scherrer ring; Fourier series; Inverse problem; Singular value decomposition