Startseite Electrical conductivity variation of (Bi2Te3)0.25(Sb2Te3)0.75 crystal grown using the zone melting method
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Electrical conductivity variation of (Bi2Te3)0.25(Sb2Te3)0.75 crystal grown using the zone melting method

  • Ghassem Kavei , Kamran Ahmadi und Ashkan Kavei
Veröffentlicht/Copyright: 30. März 2014
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Abstract

Experiments and numerical results are presented to demonstrate the adverse effects of a zone melting method in (Bi2Te3)0.25(Sb2Te3)0.75 thermoelectric crystallization, on mass transport. The zone melting method shows a considerable effect from the deflection of the solid–liquid interface, and the Bi2Te3 stoichiometry changes significantly. Electrical conductivity measurements of the crystallized ingot were carried out at stepped intervals of length (each step is 7 mm). A considerable gradient was observed in the readings from the tip to the end of the ingot. To understand this variation taking into account all empirical aspects of crystal growth, we conducted a numerical study because it gives vast information on the crystal growth process. Simulating the crystallization process and characterization of the ingot reveals a variation in the measured values of the thermoelectric parameters, which was attributed to the deviation of Bi2Te3 concentration along the ingot.


* Correspondence address, Prof. G. Kavei, Semiconductor Division, Material and Energy Research Centre (MERC), Meshgin-Dasht, Karaj, P.O. Box 31787-316, Tehran 3177983634, Iran. Tel.: +98 263 6204131-4, Fax: +98 263 6201888, E-mail:

References

[1] G.Bischopink, K.W.Benz: J. Cryst. Growth128 (1993) 466. 10.1016/0022-0248(93)90368-7Suche in Google Scholar

[2] A.N.Danilewski, P.Dold, K.W.Benz: J. Cryst. Growth121 (1992) 305. 10.1016/0022-0248(92)90140-ESuche in Google Scholar

[3] E.Koukharenko, N.Frety, V.G.Shepelevich, J.C.Tedenac: J. Alloys Compd.299 (2000) 254. 10.1016/S0925-8388(99)00688-XSuche in Google Scholar

[4] O.Sokolov, B.Skipidarov, S.Ya, N.I.Duvankovi: J. Cryst. Growth, 236, 2002,181. 10.1016/S0022-0248(01)01808-5Suche in Google Scholar

[5] M.H.Ettenberg, J.R.Maddux, P.J.Taylor, W.A.JesserF.D.Rosi: J. Cryst. Growth179 (1997) 495. 10.1016/S0022-0248(97)00133-4Suche in Google Scholar

[6] T.Boeck, P.Rudolph: J. Cryst. Growth79 (1986) 105. 10.1016/0022-0248(86)90423-9Suche in Google Scholar

[7] R.A.Meric, S.Dost, B.Lent, R.F.Redden: Int. J. Appl. Electromagnetics Mechanics, 10 (6) (1999) 5056.10.3233/JAE-1999-164Suche in Google Scholar

[8] M.C.Martinez-Tomas, V.Munos-Sanjose, C.Reig: J. Cryst. Growth243 (2002) 463. 10.1016/S0022-0248(02)01529-4Suche in Google Scholar

[9] Y.Okano, H.Kondo, W.Kishimoto, L.Li, S.Dost: J. Cryst. Growth237–239, (2002) 1716.10.1016/S0022-0248(01)02342-9Suche in Google Scholar

[10] S.Dost, Y.Liu, B.Lent: 16ème Congrès Français de Mécanique Nice, 1–5 septembre (2003) 1.Suche in Google Scholar

[11] V.Kumar, S.Dost, F.Durst: Applied Mathematical Modelling 31 Issue3 (2007) 589. 10.1016/j.apm.2005.11.022Suche in Google Scholar

[12] F.V.Wald, R.O.Bell: J. Cryst. Growth30 (1975) 29. 10.1016/0022-0248(75)90195-5Suche in Google Scholar

[13] T.A.Cherepanova, V.N.Kuzovkov: J. Cryst. Growth, 65, (1983) 55. 10.1016/0022-0248(83)90036-2Suche in Google Scholar

[14] Z.Lin, M.Li, Y.Zhou: J. Mater. Sci. Technol.23 (2007) 145. 10.1179/174328407X154338Suche in Google Scholar

[15] S.O.Kasap: Principle of Electronic Materials and Devices, Mc Graw Hill (2002) Chapter 1.Suche in Google Scholar

[16] S.M.Sze: Semiconductor Devices: physics and technology, John Wiley & Sons Inc. (2002) Chapter 8.Suche in Google Scholar

[17] G.Kavei, D.Kavei: J. Thermoelectricity2 (2011) 26.Suche in Google Scholar

[18] G.Kavei, M.A.Karami: Bull. Mater. Sci.29, (2006) 659.Suche in Google Scholar

[19] ASM Alloy Phase Diagrams Center, 2007; data from T.Caillat et al.: J. Phys. Chem. Solids, 53 (1992) 227, and M. J.Smith, R. J.Knight, C. W.Spencer: J. Appl. Phys. Vol. 33, No. 7, (1962) 2186.Suche in Google Scholar

[20] S.Dost, Y.C.Liu, B.Lent, R.F.Redden: Int. J. Appl. Electromag. & Mech.17 (2003) 271.Suche in Google Scholar

[21] J.Wolberg: Data Analysis Using the Method of Least Squares - Extracting the Most Information from Experiments, Springer, Germany (2005).Suche in Google Scholar

[22] Y.C.Liu, S.Dost, B.Lent, R.F.Redden: J. Cryst. Growth254 (2003) 285. 10.1016/S0022-0248(03)01140-0Suche in Google Scholar

Received: 2012-2-16
Accepted: 2012-8-15
Published Online: 2014-03-30
Published in Print: 2013-03-14

© 2013, Carl Hanser Verlag, München

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