Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy
-
Arent J. Kievits
,
B. H. Peter Duinkerken
,
Ryan Lane
,
Cecilia de Heus
,
Daan van Beijeren Bergen en Henegouwen
Corrigendum to: Arent J. Kievits*, B. H. Peter Duinkerken, Ryan Lane, Cecilia de Heus, Daan van Beijeren Bergen en Henegouwen, Tibbe Höppener, Anouk H. G. Wolters, Nalan Liv, Ben N. G. Giepmans and Jacob P. Hoogenboom. FAST-EM array tomography: a workflow for multibeam volume electron microscopy. Methods in Microscopy (MIM). 2024; Volume 1, Issue 1, pp. 49–64 (DOI: https://doi.org/10.1515/mim-2024-0005).
The authors have noted that some information is missing in the published article:
Data availability: The full 3D datasets as presented in this article can be viewed through Nanotomomy.org (http://www.nanotomy.org/OA/Kievits2024MIM/index.html). The full raw datasets are available through the 4TU repository (doi: https://doi.org/10.4121/bf3f2b23-2328-4d81-a0f4-05fdb33117d7) and EMPIAR (entries EMPIAR-12174, EMPIAR-12190 and EMPIAR-12193).
Software availability statement: The code to generate the 3D reconstructions presented in this article and a sample dataset are available through the 4TU repository (doi: https://doi.org/10.4121/bf3f2b23-2328-4d81-a0f4-05fdb33117d7). The scripts used to analyze the MitoNet results (Table 2) and generate the views in Figure 6 and S5 are available on Github: https://github.com/hoogenboom-group/Kievits-FASTEM-array-tomography-2024.
The reference footnote to the online data of Figure 6 is not working. The link to the data is: http://www.nanotomy.org/OA/Kievits2024MIM/index.html
Table 3 contains a minor copy-editing mistake. In the row that indicates the dwell time, the number indicated for “bd-TEM” should be the dwell time for “ATUM-MultiSEM”. The dwell time for bd-TEM is equal to the FoV acquisition time.
© 2024 the author(s), published by De Gruyter on behalf of Thoss Media
This work is licensed under the Creative Commons Attribution 4.0 International License.
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- Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy
Artikel in diesem Heft
- Frontmatter
- Editorial
- What is open access and what is it good for?
- News
- Community news
- View
- Optical sectioning in fluorescence microscopies is essential for volumetric measurements
- Review Article
- Wrapped up: advancements in volume electron microscopy and application in myelin research
- Research Articles
- Reducing artifact generation when using perceptual loss for image deblurring of microscopy data for microstructure analysis
- Utilizing collagen-coated hydrogels with defined stiffness as calibration standards for AFM experiments on soft biological materials: the case of lung cells and tissue
- Phase characterisation in minerals and metals using an SEM-EDS based automated mineralogy system
- Corrigendum
- Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy
