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ALD anti-reflection coatings at 1ω, 2ω, 3ω, and 4ω for high-power ns-laser application

  • Hao Liu , Lars Jensen EMAIL logo , Ping Ma and Detlev Ristau
Published/Copyright: March 21, 2018
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Abstract

Atomic layer deposition (ALD) facilitates the deposition of coatings with precise thickness, high surface conformity, structural uniformity, and nodular-free structure, which are properties desired in high-power laser coatings. ALD was studied to produce uniform and stable Al2O3 and HfO2 single layers and was employed to produce anti-reflection coatings for the harmonics (1ω, 2ω, 3ω, and 4ω) of the Nd:YAG laser. In order to qualify the ALD films for high-power laser applications, the band gap energy, absorption, and element content of single layers were characterized. The damage tests of anti-reflection coatings were carried out with a laser system operated at 1ω, 2ω, 3ω, and 4ω, respectively. The damage mechanism was discussed by analyzing the damage morphology and electric field intensity difference. ALD coatings exhibit stable growth rates, low absorption, and rather high laser-induced damage threshold (LIDT). The LIDT is limited by HfO2 as the employed high-index material. These properties indicate the high versatility of ALD films for applications in high-power coatings.

References

[1] D. H. Crandall, C. J. Keane, K. Bieg, L. V. Powers and M. M. Sluyter, Proc. SPIE 3047, 2–13 (1997).10.1117/12.294243Search in Google Scholar

[2] M. Bowers, J. Wisoff, M. Herrmann, T. Anklam, J. Dawson, et al., Proc. SPIE 10084, 1008403 (2017).10.1117/12.2257571Search in Google Scholar

[3] J. A. Horvath, Proc. SPIE 3047, 148–157 (1997).10.1117/12.294298Search in Google Scholar

[4] V. Denis, V. Beau, L. L. Deroff, L. Lacampagne, T. Chies, et al., Proc. SPIE 10084, 1008401 (2017).10.1117/12.2276032Search in Google Scholar

[5] C. J. Stolz, C. L. Weinzapfel, A. L. Rigatti, J. B. Oliver, J. Taniguchi, et al., Proc. SPIE 5193, 50–58 (2004).10.1117/12.511677Search in Google Scholar

[6] C. J. Stolz, J. R. Taylor, W. K. Eickelberg and J. D. Lindh, Appl. Opt. 32(28), 5666–5672 (1993).10.1364/AO.32.005666Search in Google Scholar PubMed

[7] I. Petrov, P. B. Barna, L. Hultman and J. E. Greene, J. Vac. Sci. Technol. A 21(5), S117–S126 (2003).10.1116/1.1601610Search in Google Scholar

[8] C. J. Stolz, L. M. Sheehan, S. M. Maricle, S. Schwartz, M. R. Kozlowski, et al., Proc. SPIE 3264, 105–112 (1998).10.1117/12.311905Search in Google Scholar

[9] P. A. Sermon, M. S. W. Vong, N. J. Bazin, R. Badheka and D. M. Spriggs, Proc. SPIE 2633, 464–474 (1995).10.1117/12.228295Search in Google Scholar

[10] M. R. Kozlowski and I. M. Thomas, Proc. SPIE 2262, 54–59 (1994).10.1117/12.185807Search in Google Scholar

[11] F. Beauville, D. Buskulic, R. Flaminio, F. Marion, A. Masserot, et al., Proc. SPIE 5250, 483–492 (2004).10.1117/12.516431Search in Google Scholar

[12] M. Sigwarth, J. Baumgartner, A. Bell, G. Cagnoli, A. Fischer, et al., Proc. SPIE 9908, 99084F (2016).10.1117/12.2232271Search in Google Scholar

[13] R. A. Negres, C. J. Stolz, M. D. Thomas and M. Caputo, Proc. SPIE 10447, 104470x (2017).Search in Google Scholar

[14] V. Miikkulainen, M. Leskelä, M. Ritala and R. L. Puurunen, J. Appl. Phys. 113, 021301 (2013).10.1063/1.4757907Search in Google Scholar

[15] A. Szeghalmi, M. Helgert, R. Brunner, F. Heyroth, U. Gösele, et al., Appl. Opt. 48(9), 1727–1732 (2009).10.1364/AO.48.001727Search in Google Scholar

[16] A. D. Jewell, J. Hennessy, M. E. Hoenk and S. Nikzad, Proc. SPIE 8820, 213–219 (2013).Search in Google Scholar

[17] G. Triani, P. J. Evans, D. R. G. Mitchell, D. J. Attard, K. S. Finnie, et al., Proc. SPIE 5870, 587009 (2005).10.1117/12.638039Search in Google Scholar

[18] R. Ali, M. R. Saleem, P. Pääkkönen and S. Honkanen, Nanomaterials 5(2), 792–803 (2015).10.3390/nano5020792Search in Google Scholar

[19] K. Pfeiffer, S. Shestaeva, A. Bingel, P. Munzert, L. Ghazaryan, et al., Opt. Mater. Express 6(2), 660–670 (2016).10.1364/OME.6.000660Search in Google Scholar

[20] Q. Zhang, F. Pan, J. Luo, Q. Wu, Z. Wang, et al., J. Alloys Compd. 659, 288–294 (2016).10.1016/j.jallcom.2015.11.048Search in Google Scholar

[21] Z. Liu, S. Chen, P. Ma, Y. Wei, Y. Zheng, et al., Opt. Express 20(2), 854–863 (2012).10.1364/OE.20.000854Search in Google Scholar PubMed

[22] Y. Wei, H. Liu, O. Sheng, Z. Liu, S. Chen, et al., Appl. Opt. 50(24), 4720–4727 (2011).10.1364/AO.50.004720Search in Google Scholar PubMed

[23] L. Jensen, J. Maula and D. Ristau, Proc. SPIE 8530, 206–207 (2012).Search in Google Scholar

[24] H. Liu, L. Jensen, J. Becker, M. C. Wurz, P. Ma, et al., Proc. SPIE 10014, 1001421 (2016).10.1117/12.2245051Search in Google Scholar

[25] D. Ristau, X. C. Dang and J. Ebert, NBS Spec. Publ. 727, 298–312 (1984).Search in Google Scholar

[26] E. A. Davis and N. F. Mott, Philos. Mag. A 22(179), 903–921 (1970).10.1080/14786437008221061Search in Google Scholar

[27] ISO 11551, ‘Optics and optical instruments – Lasers and laser-related equipment – Test method for absorptance of optical laser components,’ (2003).Search in Google Scholar

[28] U. Willamowski, D. Ristau and E. Welsch, Appl. Opt. 37(36), 8362–8370 (1998).10.1364/AO.37.008362Search in Google Scholar

[29] ISO 21254, ‘Lasers and laser-related equipment – Test methods for laser-induced damage threshold,’ (2011).Search in Google Scholar

[30] M. Mero, J. Liu, W. Rudolph, D. Ristau and K. Starke, Phys. Rev. B 71, 115109 (2005).10.1103/PhysRevB.71.115109Search in Google Scholar

[31] C. J. Stolz, M. Caputo, A. J. Griffin and M. D. Thomas, Proc. SPIE 7842, 784206 (2010).10.1117/12.867742Search in Google Scholar

[32] L. Jensen, M. Mende, H. Blaschke, D. Ristau, D. Nguyen, et al., Proc. SPIE 7842, 748207 (2010).10.1117/12.867238Search in Google Scholar

Received: 2017-12-7
Accepted: 2018-1-16
Published Online: 2018-3-21
Published in Print: 2018-4-25

©2018 THOSS Media & De Gruyter, Berlin/Boston

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