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Numerical correction of X-ray detector backlighting

  • Axel Lange , Manfred P. Hentschel , Andreas Kupsch and Bernd R. Müller
Published/Copyright: May 31, 2013
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International Journal of Materials Research
From the journal International Journal of Materials Research Volume 103 Issue 2

Abstract

A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals (“backlighting”) of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering by the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert–Beer's law in single projections (radiographs).

When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation phase and the sample's aspect ratio (dynamics). The magnitude of the diffuse background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shadowed area and the stronger the total attenuation. This implies that the reconstruction suffers from additional anisotropic artifacts caused by elongated sample structures.

This issue is studied simply by absorption of flat plates in a conventional laboratory radiography set-up and at a synchrotron radiation facility. In the latter case beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure requires simple integral intensity offsets as a constant (non-local) light scattering mechanism is assumed.

Keywords: Detector backlighting; X-ray detector scattering; Fluorescent screen; Diffuse background; Computed tomography
* Correspondence address Dipl.-Phys. Axel Lange, BAM-8.5, 12200 Berlin, Germany, Tel.: +49 30 81 04 36 67, Fax: +49 30 81 04 18 37, E-mail:

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Received: 2011-7-5
Accepted: 2011-11-14
Published Online: 2013-05-31
Published in Print: 2012-02-01

© 2012, Carl Hanser Verlag, München

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https://doi.org/10.3139/146.110659
Keywords for this article
Detector backlighting; X-ray detector scattering; Fluorescent screen; Diffuse background; Computed tomography

Articles in the same Issue

  1. Contents
  2. Contents
  3. Editorial
  4. Exploiting Contrast with Tomography
  5. Original Contributions
  6. 3D imaging of complex materials: the case of cement
  7. Neutron Bragg-edge mapping of weld seams
  8. 3D image analysis and stochastic modelling of open foams
  9. In-situ X-ray microtomography study of the movement of a granular material within a die
  10. Synchrotron and neutron laminography for three-dimensional imaging of devices and flat material specimens
  11. Numerical correction of X-ray detector backlighting
  12. X-ray phase contrast and fluorescence nanotomography for material studies
  13. Estimation of the probability of finite percolation in porous microstructures from tomographic images
  14. Imaging of grain-level orientation and strain in thicker metallic polycrystals by high energy transmission micro-beam Laue (HETL) diffraction techniques
  15. Three-dimensional morphology and mechanics of bone scaffolds fabricated by rapid prototyping
  16. Fatigue induced deformation of taper connections in dental titanium implants
  17. Beyond imaging: on the quantitative analysis of tomographic volume data
  18. Damage fluctuations in creep deformed copper studied with synchrotron X-ray microtomography
  19. Neutron strain tomography using Bragg-edge transmission
  20. Three-dimensional registration of tomography data for quantification in biomaterials science
  21. Morpho-topological volume analysis of porous materials for nuclear applications
  22. People
  23. Professor Dr. rer. nat. Richard Wagner
  24. DGM News
  25. DGM News
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