Structural Characterization of Surfaces and Interfaces of Materials by Applying X-ray Total External Reflection Phenomena

Artikel in diesem Heft

1. TABLE OF CONTENTS
2. Preface
3. Surface Segregated Layer and Native Oxide Layer Formed on High-Purity Iron Base Alloys by Angle-Resolved XPS
4. Sputter Depth Profiling of Thin Films
5. Use of Post-Ionisation Techniques to Complement SIMS Analysis. A Review With Practical Aspects
6. Mossbauer Spectroscopy and its Application to Materials Research
7. Positron Annihilation Method: Thermal and Non-Thermal Defects in Refractory Intermetallics
8. Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
9. REVIEW: Quantitative Transmission Electron Microscopy with Imaging Plates
10. Glow Discharge Optical Emission Spectroscopy- The Fundamental Principles
11. Structural Characterization of Surfaces and Interfaces of Materials by Applying X-ray Total External Reflection Phenomena
12. Structural Studies of Aqueous Solutions by the Anomalous X-ray Scattering Method