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Quantification of elemental segregation to lath and grain boundaries in low-alloy steel by STEM X-ray mapping combined with the ζ-factor method

  • M. Watanabe EMAIL logo and D. B. Williams
Published/Copyright: January 11, 2022
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Abstract

Elemental segregation to two types of boundaries in a low-alloy steel were studied by X-ray mapping using scanning transmission electron microscopy (STEM). To quantify the acquired X-ray maps, the ζ-factor method was applied, and then the compositional maps and the thickness map were obtained. Based on these quantified maps, further information about the analytical sensitivity of solute-element detection and the spatial resolution of segregation analysis were extracted. Furthermore, maps of the number of excess atoms on the boundary were also calculated from the compositional and thickness maps. It was concluded that Cr, Ni and Mo are co-segregated on the prior-austenite grain boundary and only Ni was segregated on the lath boundary.


Masashi Watanabe Department of Materials Science and Engineering Lehigh University 5 E. Packer Ave., Bethlehem, PA, 18015-3195, USA Tel.: +1 610 758 4002 Fax: +1 610 758 3526
Dedicated to Professor Dr. Dr. h. c. Manfred Rühle on the occasion of his 65th birthday

Funding statement: The authors acknowledge Dr. M. G. Burke at Bechtel-Bettis Labs. Inc. for useful discussions and DBW wishes to acknowledge the support of the National Science Foundation through grant DMR 99-72670.

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Received: 2002-08-27
Published Online: 2022-01-11

© 2003 Carl Hanser Verlag, München

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  2. Editorial
  3. Editorial
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  18. Never ending saga of a simple boundary
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  23. Some thoughts on source monochromation and the implications for electron energy loss spectroscopy
  24. Determination of the contrast transfer function by analysing diffractograms of thin amorphous foils
  25. Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning
  26. Quantification of interfacial segregation by analytical electron microscopy
  27. Quantification of elemental segregation to lath and grain boundaries in low-alloy steel by STEM X-ray mapping combined with the ζ-factor method
  28. Microstructure of Al/Ti metallization layers
  29. Connectivity of CSL grain boundaries and the role of deviations from exact coincidence
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