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Determination of the contrast transfer function by analysing diffractograms of thin amorphous foils

  • Rainer Knippelmeyer , Andreas Thesing and Helmut Kohl EMAIL logo
Published/Copyright: January 11, 2022
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Abstract

We have analysed diffractograms of elastically filtered phase contrast images of thin evaporated amorphous silicon and carbon foils. For this analysis the two-particle structure factor was taken into account. It was determined from diffractograms of inelastically filtered images using calculated inelastic transfer functions. Due to the high accuracy of this new method, we were able to explain and reproduce quantitatively the intensity profile in the low spatial frequency range of the elastically filtered diffractograms. We could show that the weak-phase object approximation, which is normally used for the evaluation of such diffractograms is not adequate in this region. Instead, one has to use the weak-object approximation, which allows for a small imaginary part of the atomic scattering factor. In spite of the latter being only 3–10 % of the real part for the analysed materials it is observable, because the two-particle structure factor increases steeply for low spatial frequencies (in the direction of decreasing spatial frequencies).


Prof. Dr. Helmut Kohl Physikalisches Institut und Interdisziplinäres Centrum für Elektronenmikroskopie und Mikroanalyse (ICEM) Wilhelm-Klemm-Str. 10, D-48149 Münster, Germany Tel.:+49 251 83 33640 Fax: +49 251 83 33602
Dedicated to Professor Dr. Dr. h. c. Manfred Rühle on the occasion of his 65th birthday

Funding statement: This work is part of a Ph. D. dissertation and a diploma thesis at the Mathematisch-Naturwissenschaftliche Fakultät of the Westfälische Wilhelms-Universität Münster. Financial support by the Deutsche Forschungsgemeinschaft (Ko 885/7-1 and 7-2) is gratefully acknowledged. R. K. would like to thank G. Möbus for fruitful discussions.

References

[1] G. Möbus, M. Rühle: Optik 93 (1993) 108.Search in Google Scholar

[2] J.M. Gibson: Ultramicroscopy 56 (1994) 26.10.1016/0304-3991(94)90143-0Search in Google Scholar

[3] H.S. Baik, T. Epicier, E. Van Capellen: Eur. Phys. J. Appl. Phys. 4 (1998) 11.10.1051/epjap:1998240Search in Google Scholar

[4] R. Knippelmeyer, A. Thesing, H. Kohl, in: L. Frank, F. Čiampor (Eds.), Proc. 12th Eur. Congr. Electr. Micr., Vol. III, Czechoslovak Society for Electron Microscopy, Brno (2000) 391.Search in Google Scholar

[5] R. Knippelmeyer, H. Kohl, in: As Ref. [4], Vol. II, p. 457.Search in Google Scholar

[6] R. Knippelmeyer, H. Kohl: J. Microscopy 194 (1999) 30.10.1046/j.1365-2818.1999.00470.xSearch in Google Scholar

[7] L. Reimer: Transmission Electron Microscopy, Physics of Image Formation and Microanalysis, Springer Series in Optical Sciences 36, Springer, Berlin (1997).Search in Google Scholar

[8] E.J. Kirkland: Advanced Computing in Electron Microscopy, Plenum Press, New York (1998).10.1007/978-1-4757-4406-4Search in Google Scholar

[9] O.L. Krivanek, in: P. Buseck, J. Cowley, L. Eyring (Eds.): High Resolution Transmission Electron Microscopy Associated Techniques, Oxford University Press, Oxford (1988) 519.Search in Google Scholar

[10] R. Knippelmeyer: Ph. D. Thesis, Westf. Wilhelms-Universität Münster (2000).Search in Google Scholar

[11] K.J. Hanszen: Adv. Opt. Electr. Micr. 4 (1971) 1.Search in Google Scholar

[12] G. Möbus: Ph. D. Thesis, Stuttgart (1994).Search in Google Scholar

[13] H. Kohl, H. Rose: Adv. Electron. El. Phys. 65 (1985) 173.10.1016/S0065-2539(08)60878-1Search in Google Scholar

[14] A. Berger, H. Kohl: Microsc. Microanal. Microstruct. 3 (1992) 159.10.1051/mmm:0199200302-3015900Search in Google Scholar

[15] R.F. Egerton, S.C. Cheng: Ultramicroscopy 21 (1987) 231.10.1016/0304-3991(87)90148-3Search in Google Scholar

[16] C. Hülk, I. Daberkov, in: H.A. Calderón Benavides, M. Jose Yacamán (Eds.), Electron Microscopy 1998, Proc. 14th Int. Congr. on Electron Microscopy, Cancun (Mexico), 31 August-4 September, 1998, Vol. I, Institute of Physics Publishing, Bristol (1998) 189.Search in Google Scholar

[17] C. Hülk: Ph. D. Thesis, Westf. Wilhelms-Universität Münster (1998).Search in Google Scholar

[18] P. D’Antonio, J.H. Konnert: Phys. Rev. Lett. 43 (1979) 1161.10.1103/PhysRevLett.43.1161Search in Google Scholar

Received: 2002-10-14
Published Online: 2022-01-11

© 2003 Carl Hanser Verlag, München

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