Abstract
An amorphous covalent silicon-, carbon- and nitrogen-containing solid is prepared by the thermolysis of a polyvinylsilazane. Crystallization of the metastable material is induced by subsequent heat treatment at 1600 °C. For that purpose, microwave and conventional heating are applied and compared. The resulting materials are investigated by conventional and analytical transmission electron microscopy and X-ray diffraction. In the case of the conventionally heated material, thermal degradation occurs accompanied by a strong reduction of the nitrogen content. In contrast, kinetic stabilization of the Si–C–N solid by microwave heating is observed. Based on thermodynamic considerations, a model for the high-temperature behavior of the material is presented.
Funding statement: The financial support of the Deutsche Forschungsgemeinschaft within the scope of the Graduate Program “Interfaces in Crystalline Materials” is acknowledged.
References
[1] R. Rice: Ceram. Soc. Bull. 62 (1983) 916.Search in Google Scholar
[2] D. Seyferth, G.H. Wiseman: J. Am. Ceram. Soc. 67 (1984) 132.Search in Google Scholar
[3] J. Bill, F. Aldinger: Adv. Mater. 7 (1995) 775.10.1002/adma.19950070903Search in Google Scholar
[4] J. Weiss, H.L. Lukas, J. Lorenz, G. Petzow, H. Krieg: Calphad 5 (1981) 125.10.1016/0364-5916(81)90039-0Search in Google Scholar
[5] H.J. Seifert, H.L. Lukas, F. Aldinger: Ber. Bunsenges. Phys. Chem. 9 (1998)1309.10.1002/bbpc.19981020942Search in Google Scholar
[6] W.H. Sutton: Ceram. Bull. 68 (1989) 376.Search in Google Scholar
[7] Polyvinylsilazane VT50, Hoechst AG, Frankfurt, Germany.Search in Google Scholar
[8] J. Seitz, J. Bill: J. Mat. Sci. Lett. 15 (1996) 39110.1007/BF00277175Search in Google Scholar
[9] S. Lanio, H. Rose, D. Krahl: Optik 73 (1986) 56Search in Google Scholar
[10] M.A. Janney, H.D. Kimrey, J.O. Kiggans, in: R.L. Beatty, W.H. Sutton, M.F. Iskander (Eds.), Microwave Processing of Ceramics.: Microwave Processing of Materials III, Symposium Proceedings, Vol. 269, Materials Research Society, Pittsburgh, PA (1992) 173.10.1557/PROC-269-173Search in Google Scholar
[11] H.J. Seifert, F. Aldinger, in: J. Bill, F. Wakai, F. Aldinger (Eds.), Precursor-Derived Ceramics, Wiley-VCH, Weinheim (1999) 165.Search in Google Scholar
© 2003 Carl Hanser Verlag, München
Articles in the same Issue
- Frontmatter
- Editorial
- Editorial
- Articles/Aufsätze
- The role of oxidation-induced cavities on the failure of the thermally grown oxide on binary β-NiAl alloys
- Phase stability of Y + Gd co-doped zirconia
- Mechanisms governing the distortion of alumina-forming alloys upon cyclic oxidation
- High-temperature oxidation of FeCrAl alloys: the effect of Mg incorporation into the alumina scale
- Nonlinear dielectric properties at oxide grain boundaries
- TEM observations of singular grain boundaries and their roughening transition in TiO2-excess BaTiO3
- Processing of dense MgO substrates for high-temperature superconductors
- Microwave-induced crystallization of polysilazane-derived silicon carbonitride
- Schottky barrier formation in liquid-phase-sintered silicon carbide
- SrTiO3: a model electroceramic
- Optical properties and electronic structure of oxidized and reduced single-crystal strontium titanate
- Spreading of liquid Ag and Ag–Mo alloys on molybdenum substrates
- Nanoalloying in mixed AgmAun nanowires
- Never ending saga of a simple boundary
- Comparison of interfacial chemistry at Cu/α-alumina and Cu/γ-alumina interfaces
- Microstructure of Cu2O/Si interfaces, made by epitaxial electrodeposition
- Metal/oxide interfaces and their reaction with hydrogen
- Amorphous films at metal/ceramic interfaces
- Some thoughts on source monochromation and the implications for electron energy loss spectroscopy
- Determination of the contrast transfer function by analysing diffractograms of thin amorphous foils
- Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning
- Quantification of interfacial segregation by analytical electron microscopy
- Quantification of elemental segregation to lath and grain boundaries in low-alloy steel by STEM X-ray mapping combined with the ζ-factor method
- Microstructure of Al/Ti metallization layers
- Connectivity of CSL grain boundaries and the role of deviations from exact coincidence
- Effect of laser shock processing on the microstructure and mechanical properties of pure Cu
- Growth and microstructure of iron nitride layers and pore formation in ε-Fe3N
- Phase diagram of the Al–Cu–Fe quasicrystal-forming alloy system
- Notifications/Mitteilungen
- Personal/Personelles
- Gesellschaftsnachricht
- International Conferences
Articles in the same Issue
- Frontmatter
- Editorial
- Editorial
- Articles/Aufsätze
- The role of oxidation-induced cavities on the failure of the thermally grown oxide on binary β-NiAl alloys
- Phase stability of Y + Gd co-doped zirconia
- Mechanisms governing the distortion of alumina-forming alloys upon cyclic oxidation
- High-temperature oxidation of FeCrAl alloys: the effect of Mg incorporation into the alumina scale
- Nonlinear dielectric properties at oxide grain boundaries
- TEM observations of singular grain boundaries and their roughening transition in TiO2-excess BaTiO3
- Processing of dense MgO substrates for high-temperature superconductors
- Microwave-induced crystallization of polysilazane-derived silicon carbonitride
- Schottky barrier formation in liquid-phase-sintered silicon carbide
- SrTiO3: a model electroceramic
- Optical properties and electronic structure of oxidized and reduced single-crystal strontium titanate
- Spreading of liquid Ag and Ag–Mo alloys on molybdenum substrates
- Nanoalloying in mixed AgmAun nanowires
- Never ending saga of a simple boundary
- Comparison of interfacial chemistry at Cu/α-alumina and Cu/γ-alumina interfaces
- Microstructure of Cu2O/Si interfaces, made by epitaxial electrodeposition
- Metal/oxide interfaces and their reaction with hydrogen
- Amorphous films at metal/ceramic interfaces
- Some thoughts on source monochromation and the implications for electron energy loss spectroscopy
- Determination of the contrast transfer function by analysing diffractograms of thin amorphous foils
- Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning
- Quantification of interfacial segregation by analytical electron microscopy
- Quantification of elemental segregation to lath and grain boundaries in low-alloy steel by STEM X-ray mapping combined with the ζ-factor method
- Microstructure of Al/Ti metallization layers
- Connectivity of CSL grain boundaries and the role of deviations from exact coincidence
- Effect of laser shock processing on the microstructure and mechanical properties of pure Cu
- Growth and microstructure of iron nitride layers and pore formation in ε-Fe3N
- Phase diagram of the Al–Cu–Fe quasicrystal-forming alloy system
- Notifications/Mitteilungen
- Personal/Personelles
- Gesellschaftsnachricht
- International Conferences