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Heusler films and multilayers: X-ray resonant magnetic scattering and polarized neutron reflectivity studies on the relation between structure and magnetism

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Published/Copyright: May 23, 2013

Abstract

We have studied the structural properties and the magnetization density profiles in multilayers of the Heusler phase CoMnGe with three different spacer layers: V, Au, and AlO, using hard X-ray scattering, soft X-ray resonant magnetic scattering, and polarized neutron reflectivity. We have found that the spacer layer has a significant effect on the magnetization profile of the CoMnGe layer. In all cases the interlayers at the top and the bottom of the Heusler layer exhibit a reduced magnetic moment, the thickness of which depends on the spacer layer and increases from 0.5 nm for V, to 0.6 nm for Au and 1 nm for AlO.


* Correspondence address, Prof. H. Zabel, Fakultät für Physik und Astronomie, Ruhr-Universität Bochum, D-44780 Bochum, Germany, Tel.: +49 0 234 322 3649, Fax: +49 0 234 321 4173, E-mail:

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Received: 2007-11-19
Accepted: 2008-2-12
Published Online: 2013-05-23
Published in Print: 2008-05-01

© 2008, Carl Hanser Verlag, München

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  1. Contents
  2. Contents
  3. Editorial
  4. Prof. Dr. Reiner Kirchheim
  5. Review
  6. Laser-assisted atom probe tomography and nanosciences
  7. Heusler films and multilayers: X-ray resonant magnetic scattering and polarized neutron reflectivity studies on the relation between structure and magnetism
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