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Inspection of defects in CFRP by improved magnetic induction tomography

  • Lipan Zhang , Qifeng Meng , Kai Song , Ming Gao and Zhiyuan Cheng
Published/Copyright: February 21, 2019
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Abstract

Magnetic induction tomography (MIT), a relatively new method of non-destructive testing, is applied to monitor the structural health of carbon fiber reinforced plastics (CFRP). MIT utilizes inductive coils to map the properties of an object. A 3D finite element model of the sensor operation with defects in different CFRP layers is developed to obtain the sensitivity profile and solve the MIT forward problem. Moreover, a linear back projection algorithm was performed to reconstruct images for on-line detection. The results showed that the voltage values induced in the detection coil increase significantly at the defect positions within the related layer. Moreover, the average voltage of the layer with the defect is always higher than at the other layers. This indicates that MIT can easily detect not only surface defects of CFRP but also internal defects successfully and localize them accurately in depth as well.


*Correspondence Address, Prof. Song Kai, Nanchang Hangkong University, Yifu building 211, Fenghe Nan Road 696, 330063 Nanchang, P. R. China, E-mail:

Zhang Lipan, born in 1976, graduated from Nanchang Hangkong University, majoring in material processing engineering. She has been engaged in teaching and scientific research on NDT of materials at Nanchang Hangkong University, Nanchang, China since 2004.

Meng Qifeng, born in 1992, has studied electromagnetic nondestructive testing and photoelectric engineering at Nanchang Hangkong University, Nanchang, China since 2016.

Prof. Song Kai, born in 1975, graduated from Huazhong University of Science and Technology, China majoring in measurement technology and instruments. He has been engaged in the teaching and scientific research of new electromagnetic NDT technology at Nanchang Hangkong University since 1999, and has been director of the State Key Laboratory of Non-destruction Testing, Nanchang, China.

Gao Ming, born in1989, has studied electromagnetic nondestructive testing and photoelectric engineering at Nanchang Hangkong University, Nanchang, China since 2011.

Cheng Zhiyuan, born 1992, has studied electromagnetic nondestructive testing and photoelectric engineering at Nanchang Hangkong University, Nanchang, China since 2012.


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Published Online: 2019-02-21
Published in Print: 2019-03-01

© 2019, Carl Hanser Verlag, München

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