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Recent developments targeting new and experienced users in EXPGUI, an open source Rietveld analysis interface
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Charles H. Lake
Veröffentlicht/Copyright:
23. September 2011
Abstract
EXPGUI is an open source interface that supplements the GSAS program package, which together provide a powerful set of tools for structure refinement, especially Rietveld Analysis. The combined GSAS-EXPGUI packages are freely distributed and are ideal for both new and experienced users. The latest EXPGUI version includes many new intuitive features including methods of implementing distance restraints, fixing coordinates, advanced searching and viewing of interatomic distances and angles as well as improved user friendliness and much more.
Published Online: 2011-09-23
Published in Print: 2011-12
© by Oldenbourg Wissenschaftsverlag, Indiana, Germany
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Artikel in diesem Heft
- Preface: Modern Rietveld Analysis
- Preface: Modern Rietveld Analysis
- Obtaining models suitable for Rietveld refinement: the EXPO2011 techniques
- Complex inorganic structures from powder diffraction:case of tetrahydroborates of light metals
- Recent developments targeting new and experienced users in EXPGUI, an open source Rietveld analysis interface
- Testing different methods for estimating uncertainties on Rietveld refined parameters using SrRietveld
- Understanding anisotropic microstrain broadening in Rietveld refinement
- On the modelling of the powder pattern from a nanocrystalline material
- Rietveld refinement of energy-dispersive synchrotron measurements
- Description and survey of methodologies for the determination of amorphous content via X-ray powder diffraction
- A case study of parameterized Rietveld refinement:The structural phase transition of CuInSe2
Artikel in diesem Heft
- Preface: Modern Rietveld Analysis
- Preface: Modern Rietveld Analysis
- Obtaining models suitable for Rietveld refinement: the EXPO2011 techniques
- Complex inorganic structures from powder diffraction:case of tetrahydroborates of light metals
- Recent developments targeting new and experienced users in EXPGUI, an open source Rietveld analysis interface
- Testing different methods for estimating uncertainties on Rietveld refined parameters using SrRietveld
- Understanding anisotropic microstrain broadening in Rietveld refinement
- On the modelling of the powder pattern from a nanocrystalline material
- Rietveld refinement of energy-dispersive synchrotron measurements
- Description and survey of methodologies for the determination of amorphous content via X-ray powder diffraction
- A case study of parameterized Rietveld refinement:The structural phase transition of CuInSe2
