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Preface: Modern Rietveld Analysis

  • Hugo M. Rietveld
Published/Copyright: October 12, 2011
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Zeitschrift für Kristallographie
From the journal Zeitschrift für Kristallographie Volume 226 Issue 12

Published Online: 2011-10-12
Published in Print: 2011-12

© by Oldenbourg Wissenschaftsverlag, 1817 HW Alkmaar, Germany

Articles in the same Issue

  1. Preface: Modern Rietveld Analysis
  2. Preface: Modern Rietveld Analysis
  3. Obtaining models suitable for Rietveld refinement: the EXPO2011 techniques
  4. Complex inorganic structures from powder diffraction:case of tetrahydroborates of light metals
  5. Recent developments targeting new and experienced users in EXPGUI, an open source Rietveld analysis interface
  6. Testing different methods for estimating uncertainties on Rietveld refined parameters using SrRietveld
  7. Understanding anisotropic microstrain broadening in Rietveld refinement
  8. On the modelling of the powder pattern from a nanocrystalline material
  9. Rietveld refinement of energy-dispersive synchrotron measurements
  10. Description and survey of methodologies for the determination of amorphous content via X-ray powder diffraction
  11. A case study of parameterized Rietveld refinement:The structural phase transition of CuInSe2
https://doi.org/10.1524/zkri.2011.0004

Articles in the same Issue

  1. Preface: Modern Rietveld Analysis
  2. Preface: Modern Rietveld Analysis
  3. Obtaining models suitable for Rietveld refinement: the EXPO2011 techniques
  4. Complex inorganic structures from powder diffraction:case of tetrahydroborates of light metals
  5. Recent developments targeting new and experienced users in EXPGUI, an open source Rietveld analysis interface
  6. Testing different methods for estimating uncertainties on Rietveld refined parameters using SrRietveld
  7. Understanding anisotropic microstrain broadening in Rietveld refinement
  8. On the modelling of the powder pattern from a nanocrystalline material
  9. Rietveld refinement of energy-dispersive synchrotron measurements
  10. Description and survey of methodologies for the determination of amorphous content via X-ray powder diffraction
  11. A case study of parameterized Rietveld refinement:The structural phase transition of CuInSe2
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