Understanding anisotropic microstrain broadening in Rietveld refinement
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Andreas Leineweber
Abstract
Anisotropic, i.e.hkl-dependent microstrain broadening of Bragg peaks as observed in powder-diffraction measurements often obstructs finding a good description of the peak profiles during Rietveld refinement. This review describes strategies to model this type of structural line broadening. Emphasis is put, further, on the possible physical background of the refined width parameters in terms of compositional, thermal and elastic microstrain. Methods are described to extract thus quantitative microstructural information. Moreover, it is shown how the anisotropy of the microstrain broadening can reveal the anisotropy of intrinsic properties of the solid, which may otherwise be difficult to determine, e.g. compositional lattice-parameter changes or elastic compliance.
© by Oldenbourg Wissenschaftsverlag, Stuttgart, Germany
Articles in the same Issue
- Preface: Modern Rietveld Analysis
- Preface: Modern Rietveld Analysis
- Obtaining models suitable for Rietveld refinement: the EXPO2011 techniques
- Complex inorganic structures from powder diffraction:case of tetrahydroborates of light metals
- Recent developments targeting new and experienced users in EXPGUI, an open source Rietveld analysis interface
- Testing different methods for estimating uncertainties on Rietveld refined parameters using SrRietveld
- Understanding anisotropic microstrain broadening in Rietveld refinement
- On the modelling of the powder pattern from a nanocrystalline material
- Rietveld refinement of energy-dispersive synchrotron measurements
- Description and survey of methodologies for the determination of amorphous content via X-ray powder diffraction
- A case study of parameterized Rietveld refinement:The structural phase transition of CuInSe2
Articles in the same Issue
- Preface: Modern Rietveld Analysis
- Preface: Modern Rietveld Analysis
- Obtaining models suitable for Rietveld refinement: the EXPO2011 techniques
- Complex inorganic structures from powder diffraction:case of tetrahydroborates of light metals
- Recent developments targeting new and experienced users in EXPGUI, an open source Rietveld analysis interface
- Testing different methods for estimating uncertainties on Rietveld refined parameters using SrRietveld
- Understanding anisotropic microstrain broadening in Rietveld refinement
- On the modelling of the powder pattern from a nanocrystalline material
- Rietveld refinement of energy-dispersive synchrotron measurements
- Description and survey of methodologies for the determination of amorphous content via X-ray powder diffraction
- A case study of parameterized Rietveld refinement:The structural phase transition of CuInSe2
