Abstract
The local atomic structure near an Nb atom in a Ti–20 at. %Nb alloy single crystal, which consists of the β, α′′ and ω Ti phases, was investigated by means of X-ray fluorescence holography (XFH). The atomic images were reconstructed in the vicinity of an Nb atom, which is one of the typical β stabilizing elements in β Ti alloys. Most atoms in the β Ti primary phase were reconstructed clearly. The atoms in the α′′ Ti martensite phase could not be reconstructed, because the α′′ Ti martensite has the crystal structure with low symmetry. Some atoms in the ω Ti fine precipitates were reconstructed successfully, although the amount of the ω Ti phase was much smaller than that of the β phase. An Nb atom and its first nearest neighbors tend to keep the BCC structure even upon the ω Ti phase formation.
Acknowledgement
The experiments were performed at the BL39XU beamline in the SPring-8 with the approval of the Japan Synchrotron Radiation Research Institute (Proposal No. 2010B1101). Preparation of the specimen used in this study was supported by the cooperative research of the CRDAM-IMR, Tohoku University. This work was partially supported by JSPS Grant-in-Aid for Scientific Research (B) (No. 22360264), Challenging Exploratory Research (No. 21654039) and Scientific Research on Innovative Areas “3D Active-Site Science” (No. 15H01040). This work was also supported by Cross-ministerial Strategic Innovation Promotion Program (SIP).
©2016 Walter de Gruyter Berlin/Boston
Articles in the same Issue
- Frontmatter
- Preface
- Element Specific Structure Determination Using Modern X-ray and Neutron Techniques
- Fast Calculation Algorithm Using Barton's Method for Reconstructing Three-Dimensional Atomic Images from X-ray Fluorescence Holograms
- Matrix Effects in X-ray Fluorescence Holography: Samples of Arbitrary Thickness
- Atomic Structure Imaging in ZnSe and Mixed Zn0.74Mn0.2Be0.06Se Crystals with X-ray Fluorescence Holography
- X-ray Fluorescence Holographic Study on High-Temperature Superconductor FeSe0.4Te0.6
- Crystalline Quality and Structure of MBE-Grown Ferromagnetic Semiconductor ZnSnAs2:Mn Thin Films Revealed by High-Resolution X-ray Diffraction Measurements
- X-ray Fluorescence Holography for a Ti–Nb Binary Alloy Consisting of the Martensite, Austenite and Omega Phase
- Circular Dichroism in Cu Resonant Auger Electron Diffraction
- The Use of X-ray Absorption Spectra for Validation of Classical Force-Field Models
- Local Structure of Cobalt Tungstate Revealed by EXAFS Spectroscopy and Reverse Monte Carlo/Evolutionary Algorithm Simulations
- Confirmation of no Structural and Chemical Changes in Curie Temperature Variable Co Ultrathin Films by Electric Field
- Dynamical Response of the Electric Double Layer Structure of the DEME-TFSI Ionic Liquid to Potential Changes Observed by Time-Resolved X-ray Reflectivity
Articles in the same Issue
- Frontmatter
- Preface
- Element Specific Structure Determination Using Modern X-ray and Neutron Techniques
- Fast Calculation Algorithm Using Barton's Method for Reconstructing Three-Dimensional Atomic Images from X-ray Fluorescence Holograms
- Matrix Effects in X-ray Fluorescence Holography: Samples of Arbitrary Thickness
- Atomic Structure Imaging in ZnSe and Mixed Zn0.74Mn0.2Be0.06Se Crystals with X-ray Fluorescence Holography
- X-ray Fluorescence Holographic Study on High-Temperature Superconductor FeSe0.4Te0.6
- Crystalline Quality and Structure of MBE-Grown Ferromagnetic Semiconductor ZnSnAs2:Mn Thin Films Revealed by High-Resolution X-ray Diffraction Measurements
- X-ray Fluorescence Holography for a Ti–Nb Binary Alloy Consisting of the Martensite, Austenite and Omega Phase
- Circular Dichroism in Cu Resonant Auger Electron Diffraction
- The Use of X-ray Absorption Spectra for Validation of Classical Force-Field Models
- Local Structure of Cobalt Tungstate Revealed by EXAFS Spectroscopy and Reverse Monte Carlo/Evolutionary Algorithm Simulations
- Confirmation of no Structural and Chemical Changes in Curie Temperature Variable Co Ultrathin Films by Electric Field
- Dynamical Response of the Electric Double Layer Structure of the DEME-TFSI Ionic Liquid to Potential Changes Observed by Time-Resolved X-ray Reflectivity