Matrix Effects in X-ray Fluorescence Holography: Samples of Arbitrary Thickness
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Abstract
The influence of matrix effects i.e. beam attenuation (BA) and indirect excitation (IE) on local structure imaging with multiple-energy x-ray fluorescence holography is studied using computer simulations. An analytic formalism is developed which allows for the description of BA and IE when the thickness of the sample is arbitrary. It is shown that beyond the thin-sample approximation, in specific cases, the measured holograms cannot be treated as entirely element sensitive. Consequently, it is demonstrated that due to the reduction of element sensitivity, spurious maxima can arise in the holographic reconstruction which can be misinterpreted as atomic images. The proposed formalism allows one to analyse BA and IE and to correct for them. It opens way for quantitative interpretation of x-ray fluorescence holograms.
Acknowledgement
This work was supported by the Polish National Science Center (grant. DEC-2013/09/N/ST3/04111). DTD acknowledges the support from the KNOW Research Consortium through the Marian Smoluchowski fellowship.
©2015 Walter de Gruyter Berlin/Boston
Articles in the same Issue
- Frontmatter
- Preface
- Element Specific Structure Determination Using Modern X-ray and Neutron Techniques
- Fast Calculation Algorithm Using Barton's Method for Reconstructing Three-Dimensional Atomic Images from X-ray Fluorescence Holograms
- Matrix Effects in X-ray Fluorescence Holography: Samples of Arbitrary Thickness
- Atomic Structure Imaging in ZnSe and Mixed Zn0.74Mn0.2Be0.06Se Crystals with X-ray Fluorescence Holography
- X-ray Fluorescence Holographic Study on High-Temperature Superconductor FeSe0.4Te0.6
- Crystalline Quality and Structure of MBE-Grown Ferromagnetic Semiconductor ZnSnAs2:Mn Thin Films Revealed by High-Resolution X-ray Diffraction Measurements
- X-ray Fluorescence Holography for a Ti–Nb Binary Alloy Consisting of the Martensite, Austenite and Omega Phase
- Circular Dichroism in Cu Resonant Auger Electron Diffraction
- The Use of X-ray Absorption Spectra for Validation of Classical Force-Field Models
- Local Structure of Cobalt Tungstate Revealed by EXAFS Spectroscopy and Reverse Monte Carlo/Evolutionary Algorithm Simulations
- Confirmation of no Structural and Chemical Changes in Curie Temperature Variable Co Ultrathin Films by Electric Field
- Dynamical Response of the Electric Double Layer Structure of the DEME-TFSI Ionic Liquid to Potential Changes Observed by Time-Resolved X-ray Reflectivity
Articles in the same Issue
- Frontmatter
- Preface
- Element Specific Structure Determination Using Modern X-ray and Neutron Techniques
- Fast Calculation Algorithm Using Barton's Method for Reconstructing Three-Dimensional Atomic Images from X-ray Fluorescence Holograms
- Matrix Effects in X-ray Fluorescence Holography: Samples of Arbitrary Thickness
- Atomic Structure Imaging in ZnSe and Mixed Zn0.74Mn0.2Be0.06Se Crystals with X-ray Fluorescence Holography
- X-ray Fluorescence Holographic Study on High-Temperature Superconductor FeSe0.4Te0.6
- Crystalline Quality and Structure of MBE-Grown Ferromagnetic Semiconductor ZnSnAs2:Mn Thin Films Revealed by High-Resolution X-ray Diffraction Measurements
- X-ray Fluorescence Holography for a Ti–Nb Binary Alloy Consisting of the Martensite, Austenite and Omega Phase
- Circular Dichroism in Cu Resonant Auger Electron Diffraction
- The Use of X-ray Absorption Spectra for Validation of Classical Force-Field Models
- Local Structure of Cobalt Tungstate Revealed by EXAFS Spectroscopy and Reverse Monte Carlo/Evolutionary Algorithm Simulations
- Confirmation of no Structural and Chemical Changes in Curie Temperature Variable Co Ultrathin Films by Electric Field
- Dynamical Response of the Electric Double Layer Structure of the DEME-TFSI Ionic Liquid to Potential Changes Observed by Time-Resolved X-ray Reflectivity
