Abstract
To observe the difference of atomic heights between the Se and Te layers with respect to the Fe layer in FeSe0.4Te0.6 single crystal, a Fe Kα fluorescence X-ray holography (XFH) experiment was performed at room temperature. The crystal structure of superconductor FeSe0.4Te0.6 obtained by X-ray diffraction (XRD) at a low temperature has distinct z-coordinates of Se and Te, remarkably different from each other. The reconstructed atomic image around central Fe atoms by XFH, however, reveals the different and complex results.
Acknowledgement
The XFH experiment was carried out at BL39XU/Spring-8 (Nos. 2014B1187 and 2015B1183). This work was supported by JSPS Grant-in-Aid for Scientific Research on Innovative Areas “3D Active-Site Science” (No. 26105006).
©2015 Walter de Gruyter Berlin/Boston
Articles in the same Issue
- Frontmatter
- Preface
- Element Specific Structure Determination Using Modern X-ray and Neutron Techniques
- Fast Calculation Algorithm Using Barton's Method for Reconstructing Three-Dimensional Atomic Images from X-ray Fluorescence Holograms
- Matrix Effects in X-ray Fluorescence Holography: Samples of Arbitrary Thickness
- Atomic Structure Imaging in ZnSe and Mixed Zn0.74Mn0.2Be0.06Se Crystals with X-ray Fluorescence Holography
- X-ray Fluorescence Holographic Study on High-Temperature Superconductor FeSe0.4Te0.6
- Crystalline Quality and Structure of MBE-Grown Ferromagnetic Semiconductor ZnSnAs2:Mn Thin Films Revealed by High-Resolution X-ray Diffraction Measurements
- X-ray Fluorescence Holography for a Ti–Nb Binary Alloy Consisting of the Martensite, Austenite and Omega Phase
- Circular Dichroism in Cu Resonant Auger Electron Diffraction
- The Use of X-ray Absorption Spectra for Validation of Classical Force-Field Models
- Local Structure of Cobalt Tungstate Revealed by EXAFS Spectroscopy and Reverse Monte Carlo/Evolutionary Algorithm Simulations
- Confirmation of no Structural and Chemical Changes in Curie Temperature Variable Co Ultrathin Films by Electric Field
- Dynamical Response of the Electric Double Layer Structure of the DEME-TFSI Ionic Liquid to Potential Changes Observed by Time-Resolved X-ray Reflectivity
Articles in the same Issue
- Frontmatter
- Preface
- Element Specific Structure Determination Using Modern X-ray and Neutron Techniques
- Fast Calculation Algorithm Using Barton's Method for Reconstructing Three-Dimensional Atomic Images from X-ray Fluorescence Holograms
- Matrix Effects in X-ray Fluorescence Holography: Samples of Arbitrary Thickness
- Atomic Structure Imaging in ZnSe and Mixed Zn0.74Mn0.2Be0.06Se Crystals with X-ray Fluorescence Holography
- X-ray Fluorescence Holographic Study on High-Temperature Superconductor FeSe0.4Te0.6
- Crystalline Quality and Structure of MBE-Grown Ferromagnetic Semiconductor ZnSnAs2:Mn Thin Films Revealed by High-Resolution X-ray Diffraction Measurements
- X-ray Fluorescence Holography for a Ti–Nb Binary Alloy Consisting of the Martensite, Austenite and Omega Phase
- Circular Dichroism in Cu Resonant Auger Electron Diffraction
- The Use of X-ray Absorption Spectra for Validation of Classical Force-Field Models
- Local Structure of Cobalt Tungstate Revealed by EXAFS Spectroscopy and Reverse Monte Carlo/Evolutionary Algorithm Simulations
- Confirmation of no Structural and Chemical Changes in Curie Temperature Variable Co Ultrathin Films by Electric Field
- Dynamical Response of the Electric Double Layer Structure of the DEME-TFSI Ionic Liquid to Potential Changes Observed by Time-Resolved X-ray Reflectivity