Rk material measure: A model based design

Jörg Seewig; Matthias Eifler; Dorothee Hüser; Rudolf Meeß

doi:10.1515/teme-2019-0091

Article

Rk material measure

A model based design

Jörg Seewig
Prof. Dr.-Ing. Jörg Seewig studied electrical engineering at the Leibniz Universität Hannover. He gained his PhD in 2000 with a thesis on signal processing for surface roughness. Since 2008, he is chair of the institute for measurement and sensor technology at the Technische Universität Kaiserslautern. He is one of the German experts in Working Group 15 (Filtration) and Working Group 15 (Surface Texture) of ISO/TC213 Geometric Product Specification. He is project leader of various ISO documents e. g. ISO 16610-28, ISO 16610-31, ISO 16610-71 and ISO 21920-2.
, Matthias Eifler
Dr.-Ing. Matthias Eifler, M. B. A. studied mechanical engineering at the Technische Universität Kaiserslautern. He gained his PhD in 2016 with a thesis on the model-based design of material measures. Since 2016 he is a Post-Doctoral researcher at the institute for measurement and sensor technology at the Technische Universität Kaiserslautern. His research interests include calibration procedures, design and manufacturing of material measures and signal processing in geometrical product specification. He is CEO of the Opti-Cal GmbH.
, Dorothee Hüser
Dr. habil. Dorothee Hüser, researcher at Division Precision Engineering of Physikalisch-Technische Bundesanstalt (PTB) works on Dimensional Surface Metrology and on Nanoparticle Metrology. Since 2014, she has been expert in WG 15 Filtration and WG 16 Surface Texture of ISO/TC213 Geometric Product Specification. During her stay at Helmut Schmidt University, 1995 - 2002, her field of research was dimensional micrometrology by atomic force microscopy, which she finished with a Habilitation thesis. From 1987 - 1995 she worked at PTB on coordinate metrology, in particular investigating measurement uncertainties of optical sensors. She wrote her PhD thesis on this topic being supervised by Prof. Dr.-Ing. Dr. hc. Tilo Pfeifer. In 1987 she finished her Physics studies at Aachen University with a Diploma Thesis on Elementary Particle Physics.
and Rudolf Meeß
Dr.-Ing. Rudolf Meeß, born 1966, is head of the working group manufacturing technology at Physikalisch-Technische Bundesanstalt (PTB), Braunschweig.

Published/Copyright: August 10, 2019

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From the journal tm - Technisches Messen Volume 86 Issue 9

Abstract

The standard ISO 13565-2 defines the Rk parameters for the functional characterisation of technical surfaces. So far, no particular material measures for the calibration of these parameters have been defined in the international standardization. For the application and the functional behaviour of technical surfaces the Rk parameters however have a critical significance, so there is a demand by the industry to calibrate these parameters as they are increasingly applied for the quality assessment of workpieces. In the present paper, a proposal for suitable material measures is presented. An algorithm is described, which transforms the data of a real measured profile in a way that the exact defined parameters of Rk, Rpk and Rvk are equated. The material measures geometry corresponds to its later application and the target parameters are almost freely selectable. The approach for transforming surface profile data with the aid of the Abbott curve is introduced generically, solves an inverse problem and considers the influences from the manufacturing and measuring process. The designed material measure is manufactured with the aid of ultra-precision turning. In matters of the aspired industrial application, comparison measurements are carried out in order to examine the practical abilities of the material measure and the repeatability of the approach is proven.

Zusammenfassung

Die Norm DIN EN ISO 13565-2 definiert die Rk-Kenngrößen zur funktionellen Charakterisierung technischer Oberflächen. Bisher wurden allerdings keine speziellen Normale für die Kalibrierung dieser Kenngrößen in der internationalen Standardisierung vorgesehen. Für die Praxis und das funktionelle Verhalten technischer Oberflächen sind die Rk-Parameter allerdings von hoher Relevanz und da die Kenngrößen entsprechend verstärkt zur Qualitätsbeurteilung technischer Bauteile genutzt werden, existiert ein industrieller Bedarf sie zu kalibrieren. In der vorliegenden Veröffentlichung wird ein Konzept für entsprechende Kalibriernormale vorgestellt. Ein Algorithmus, welcher die Messdaten eines gemessenen Profils derart transformiert, dass exakt definierte Parameterwerte von Rk, Rpk und Rvk abgebildet werden, wird vorgestellt. Die Geometrie des Normals hängt mit seiner späteren Anwendung zusammen und die Ziel-Kenngrößen können nahezu beliebig gewählt werden. Der Ansatz ein Oberflächenprofil unter Zuhilfenahme seiner Abbott-Kurve zu transformieren wird generisch eingeführt, löst ein inverses Problem und berücksichtigt die Einflüsse aus Fertigung und Messung. Das ausgelegte Kalibriernormal wird mithilfe eines Ultrapräzisionsdrehprozesses hergestellt. Im Hinblick auf die industrielle Anwendung werden Vergleichsmessungen durchgeführt, um die praktischen Fähigkeiten des Normals und die Widerholbarkeit des Ansatzes zu demonstrieren.

Keywords: Measurement; material measures; Rk parameters; calibration; roughness; functional characterization; ISO 13565

Schlagwörter: Schlagwörter: Messung; Normale; Rk-Kenngrößen; Kalibrierung; Rauheit; funktionelle Charakterisierung; ISO 13565

Funding source: Deutsche Forschungsgemeinschaft

Award Identifier / Grant number: 172116086

Funding statement: This project is funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) – project number 172116086 - SFB 926. The Rk material measure is commercially available through the company TEVOB.

About the authors

Jörg Seewig

Prof. Dr.-Ing. Jörg Seewig studied electrical engineering at the Leibniz Universität Hannover. He gained his PhD in 2000 with a thesis on signal processing for surface roughness. Since 2008, he is chair of the institute for measurement and sensor technology at the Technische Universität Kaiserslautern. He is one of the German experts in Working Group 15 (Filtration) and Working Group 15 (Surface Texture) of ISO/TC213 Geometric Product Specification. He is project leader of various ISO documents e. g. ISO 16610-28, ISO 16610-31, ISO 16610-71 and ISO 21920-2.

Matthias Eifler

Dr.-Ing. Matthias Eifler, M. B. A. studied mechanical engineering at the Technische Universität Kaiserslautern. He gained his PhD in 2016 with a thesis on the model-based design of material measures. Since 2016 he is a Post-Doctoral researcher at the institute for measurement and sensor technology at the Technische Universität Kaiserslautern. His research interests include calibration procedures, design and manufacturing of material measures and signal processing in geometrical product specification. He is CEO of the Opti-Cal GmbH.

Dorothee Hüser

Dr. habil. Dorothee Hüser, researcher at Division Precision Engineering of Physikalisch-Technische Bundesanstalt (PTB) works on Dimensional Surface Metrology and on Nanoparticle Metrology. Since 2014, she has been expert in WG 15 Filtration and WG 16 Surface Texture of ISO/TC213 Geometric Product Specification. During her stay at Helmut Schmidt University, 1995 - 2002, her field of research was dimensional micrometrology by atomic force microscopy, which she finished with a Habilitation thesis. From 1987 - 1995 she worked at PTB on coordinate metrology, in particular investigating measurement uncertainties of optical sensors. She wrote her PhD thesis on this topic being supervised by Prof. Dr.-Ing. Dr. hc. Tilo Pfeifer. In 1987 she finished her Physics studies at Aachen University with a Diploma Thesis on Elementary Particle Physics.

Rudolf Meeß

Dr.-Ing. Rudolf Meeß, born 1966, is head of the working group manufacturing technology at Physikalisch-Technische Bundesanstalt (PTB), Braunschweig.

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Received: 2019-06-21

Accepted: 2019-07-25

Published Online: 2019-08-10

Published in Print: 2019-09-05

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Articles in the same Issue

https://doi.org/10.1515/teme-2019-0091

Keywords for this article

Measurement; material measures; Rk parameters; calibration; roughness; functional characterization; ISO 13565