Abstract
We consider the synthesis problem of two-pole contact circuits implementing given Boolean functions and admitting short fault detection test with respect to contact breaks. For each n-place Boolean function, we found the smallest possible lengths of the single and complete fault detection tests. In particular, it is shown that such length are not greater than n.
Originally published in Diskretnaya Matematika (2017) 29,№4, 66–86 (in Russian).
funding
This research was carried out with the financial support of the Russian Science Foundation (RSF) grant 14-21-00025 P.
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© 2018 Walter de Gruyter GmbH, Berlin/Boston
Artikel in diesem Heft
- Frontmatter
- Estimate of the maximal cycle length in the graph of polynomial transformation of Galois–Eisenstein ring
- Durfee squares in compositions
- On fault detection tests of contact break for contact circuits
- On the number of integer points in a multidimensional domain
- On Stone’s renewal theorem for arithmetic distributions
- Local limit theorems for one class of distributions in probabilistic combinatorics
Artikel in diesem Heft
- Frontmatter
- Estimate of the maximal cycle length in the graph of polynomial transformation of Galois–Eisenstein ring
- Durfee squares in compositions
- On fault detection tests of contact break for contact circuits
- On the number of integer points in a multidimensional domain
- On Stone’s renewal theorem for arithmetic distributions
- Local limit theorems for one class of distributions in probabilistic combinatorics