Startseite On fault detection tests of contact break for contact circuits
Artikel
Lizenziert
Nicht lizenziert Erfordert eine Authentifizierung

On fault detection tests of contact break for contact circuits

  • Kirill A. Popkov EMAIL logo
Veröffentlicht/Copyright: 10. Dezember 2018
Veröffentlichen auch Sie bei De Gruyter Brill

Abstract

We consider the synthesis problem of two-pole contact circuits implementing given Boolean functions and admitting short fault detection test with respect to contact breaks. For each n-place Boolean function, we found the smallest possible lengths of the single and complete fault detection tests. In particular, it is shown that such length are not greater than n.


Originally published in Diskretnaya Matematika (2017) 29,№4, 66–86 (in Russian).

funding

This research was carried out with the financial support of the Russian Science Foundation (RSF) grant 14-21-00025 P.


References

[1] Lupanov O.B., Asymptotic bounds on complexity of control systems, M.: Izd-vo Mosk. un-ta, 1984 (in Russian), 138 pp.Suche in Google Scholar

[2] Chegis I. A., Yablonskii S. V., “Logical methods of control of work of electric schemes”, Trudy Mat. Inst. Steklov., 51 (1958), 270–360 (in Russian).Suche in Google Scholar

[3] Yablonskiy S. V., “Reliability and control systems monitoring”, Materialy Vsesoyuznogo seminara po diskretnoy matematike i eeprilozheniyam, M.: Izd-vo Mosk. un-ta, 1986, 7–12 (in Russian).Suche in Google Scholar

[4] Yablonskiy S. V., “Some problems of reliability and monitoring of control systems”, Matematicheskie voprosy kibernetiki, M.: Nauka, 1988, 5–25 (in Russian).Suche in Google Scholar

[5] Reďkin N. P., Reliability and diagnostics schemes, M.: Izd-vo Mosk. un-ta, 1992 (in Russian), 192 pp.Suche in Google Scholar

[6] Madatyan Kh. A., “Full test for repeating contact schemes”, Problemy kibernetiki, M.: Nauka, 1970, 103–118 (in Russian).Suche in Google Scholar

[7] Reďkin N. P., “On complete checking tests for contact circuits”, Metody diskretnogo analiza v optimizatsii upravlyayushchikh system, Izd-vo IM SO AN SSSR, Novosibirsk, 1983, 80–87 (in Russian).Suche in Google Scholar

[8] Reďkin N. P., “On checking tests of closure and opening”, Metody diskretnogo analiza v optimizatsii upravlyayushchikh sistem, Izd-vo IM SO AN SSSR, Novosibirsk, 1983, 87–99 (in Russian).Suche in Google Scholar

[9] Romanov D. S., “On the synthesis of contact circuits that allow short fault detection tests”, Uchenye zapiski Kazanskogo universiteta. Fiziko-matematicheskie nauki, 156:3 (2014), 110–115 (in Russian).Suche in Google Scholar

[10] Popkov K. A., “Tests of contact closure for contact circuits”, Discrete Math. Appl., 26:5 (2016), 299–308.10.1515/dma-2016-0025Suche in Google Scholar

Received: 2017-08-07
Revised: 2017-10-18
Published Online: 2018-12-10
Published in Print: 2018-12-19

© 2018 Walter de Gruyter GmbH, Berlin/Boston

Heruntergeladen am 30.11.2025 von https://www.degruyterbrill.com/document/doi/10.1515/dma-2018-0033/pdf
Button zum nach oben scrollen