Thermophysical Property Measurement of Molten Semiconductors: Preparatory Work for Semitherm Program

Taketoshi Hibiya,; M. Watanabe,; S. Ozawa,; T. Tsukada,

doi:10.1515/HTMP.2008.27.6.449

Startseite Thermophysical Property Measurement of Molten Semiconductors: Preparatory Work for Semitherm Program

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Thermophysical Property Measurement of Molten Semiconductors: Preparatory Work for Semitherm Program

Taketoshi Hibiya, , M. Watanabe, , S. Ozawa, und T. Tsukada,

Veröffentlicht/Copyright: 6. Mai 2011

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Aus der Zeitschrift High Temperature Materials and Processes Band 27 Heft 6

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Hibiya,, Taketoshi, Watanabe,, M., Ozawa,, S. and Tsukada,, T.. "Thermophysical Property Measurement of Molten Semiconductors: Preparatory Work for Semitherm Program" High Temperature Materials and Processes, vol. 27, no. 6, 2008, pp. 449-460. https://doi.org/10.1515/HTMP.2008.27.6.449

Hibiya,, T., Watanabe,, M., Ozawa,, S. & Tsukada,, T. (2008). Thermophysical Property Measurement of Molten Semiconductors: Preparatory Work for Semitherm Program. High Temperature Materials and Processes, 27(6), 449-460. https://doi.org/10.1515/HTMP.2008.27.6.449

Hibiya,, T., Watanabe,, M., Ozawa,, S. and Tsukada,, T. (2008) Thermophysical Property Measurement of Molten Semiconductors: Preparatory Work for Semitherm Program. High Temperature Materials and Processes, Vol. 27 (Issue 6), pp. 449-460. https://doi.org/10.1515/HTMP.2008.27.6.449

Hibiya,, Taketoshi, Watanabe,, M., Ozawa,, S. and Tsukada,, T.. "Thermophysical Property Measurement of Molten Semiconductors: Preparatory Work for Semitherm Program" High Temperature Materials and Processes 27, no. 6 (2008): 449-460. https://doi.org/10.1515/HTMP.2008.27.6.449

Hibiya, T, Watanabe, M, Ozawa, S, Tsukada, T. Thermophysical Property Measurement of Molten Semiconductors: Preparatory Work for Semitherm Program. High Temperature Materials and Processes. 2008;27(6): 449-460. https://doi.org/10.1515/HTMP.2008.27.6.449

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Published Online: 2011-05-06

Published in Print: 2008-12

Artikel in diesem Heft

TABLE OF CONTENTS
The ThermoLab Project: High-Precision Thermophysical Property Data of Liquid Metals for Modelling of Industrial Solidification Processes
EML Processing Measurement Techniques
Surface Tension and Viscosity of Industrial Ti-Alloys measured by the Oscillating Drop Method on Board Parabolic Flights
Thermolab Project: Results on Thermophysical Properties Data of Iron Alloys
The ThermoLab Project: Thermophysical Properties of Superalloys
Thermolab Project: Results on Thermophysical Properties Data of Cu-based Alloys
Modelling of Electromagnetic Levitation - Consequences on Non-contact Physical Properties Measurements
Thermophysical Property Measurement of Molten Semiconductors: Preparatory Work for Semitherm Program
A Review of Electrostatic Levitation for Materials Research

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Artikel in diesem Heft

TABLE OF CONTENTS
The ThermoLab Project: High-Precision Thermophysical Property Data of Liquid Metals for Modelling of Industrial Solidification Processes
EML Processing Measurement Techniques
Surface Tension and Viscosity of Industrial Ti-Alloys measured by the Oscillating Drop Method on Board Parabolic Flights
Thermolab Project: Results on Thermophysical Properties Data of Iron Alloys
The ThermoLab Project: Thermophysical Properties of Superalloys
Thermolab Project: Results on Thermophysical Properties Data of Cu-based Alloys
Modelling of Electromagnetic Levitation - Consequences on Non-contact Physical Properties Measurements
Thermophysical Property Measurement of Molten Semiconductors: Preparatory Work for Semitherm Program
A Review of Electrostatic Levitation for Materials Research