Two Old Statistical Methods in a New Stochastic Outfit
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Xiaomin Zhai
Abstract
The so-called confidence interval for the first moment (expectation) of a random variable X based on the t-distribution and the confidence interval for the variance based on the χ2-distribution are two very important statistical methods. They allow to determine the value μ of E[X] and the value σ2 of V[X] for given confidence level β. These two statistical methods fit perfectly well into the stochastic approach and, therefore, they are used here to illustrate stochastic measurement procedures.
The first moment E[X] and the variance V[X] of a random variable X are of utmost importance and, therefore, stochastic β-measurement procedures for them are crucial for developing a stochastic model for a given random variable. In this paper the two statistical methods are used for deriving stochastic procedures.
© Heldermann Verlag
Artikel in diesem Heft
- One-sided and Two-sided Critical Values for Dixon's Outlier Test for Sample Sizes up to n = 30
- Exact Distributions of Products of Certain Random Variables
- Two Old Statistical Methods in a New Stochastic Outfit
- Optimal Maintenance/Replacement-Policy for Deteriorating Systems under Two-Phase Maintenance Strategy
- Bounds for Quantile-Based Risk Measures of Functions of Dependent Random Variables
- The Distribution of the Profile of Aluminium Coil
- A Note on the Efficiency of Nonparametric Control Chart for Monitoring Process Variability
- Control Charts for Particles in the Semiconductor Manufacturing Process
- Statistical Sampling Strategies for Geometric Tolerance Inspection by CMM
- A Critical Note on the Guide to the Expression of Uncertainty in Measurement (GUM)
Artikel in diesem Heft
- One-sided and Two-sided Critical Values for Dixon's Outlier Test for Sample Sizes up to n = 30
- Exact Distributions of Products of Certain Random Variables
- Two Old Statistical Methods in a New Stochastic Outfit
- Optimal Maintenance/Replacement-Policy for Deteriorating Systems under Two-Phase Maintenance Strategy
- Bounds for Quantile-Based Risk Measures of Functions of Dependent Random Variables
- The Distribution of the Profile of Aluminium Coil
- A Note on the Efficiency of Nonparametric Control Chart for Monitoring Process Variability
- Control Charts for Particles in the Semiconductor Manufacturing Process
- Statistical Sampling Strategies for Geometric Tolerance Inspection by CMM
- A Critical Note on the Guide to the Expression of Uncertainty in Measurement (GUM)
