Artikel
Lizenziert
Nicht lizenziert
Erfordert eine Authentifizierung
Joint Design of Economic Manufacturing Quantity, Sampling Plan and Specification Limits
-
Chung-Ho Chen
Veröffentlicht/Copyright:
18. Februar 2010
Abstract
In this paper we propose an extension of the problem to determine the economic design of a Type I continuous sampling plan (CSP-1 plan) and the economic manufacturing quantity (EMQ) under imperfect quality investigated in Chen et al. (Economic Quality Control 15: 137-146, 2000), where the economic objective equals the total inventory cost including the set-up cost, the holding cost and the expected quality loss. The extension refers to the economic specification limits. The problem can be formulated as a non-linear mixed-integer minimization problem. By solving it, the required level of product quality is obtained at minimum total inventory cost. A numerical example is given to illustrate the solution procedure.
Keywords:: Economic Manufacturing Quantity (EMQ); Type I Continuous Sampling Plan (CSP–1 Plan); Average Outgoing Quality (AOQ); Average Outgoing Quality Limit (AOQL); Average Fraction Inspected (AFI); Specification Limits; Taguchi's Quality Loss Function
Published Online: 2010-02-18
Published in Print: 2002-October
© Heldermann Verlag
Sie haben derzeit keinen Zugang zu diesem Inhalt.
Sie haben derzeit keinen Zugang zu diesem Inhalt.
Artikel in diesem Heft
- Determination of Specifications for Tensile Strength of Castings
- Joint Design of Economic Manufacturing Quantity, Sampling Plan and Specification Limits
- Measurement Procedures for the Variance of a Normal Distribution
- A Bayesian View on Detecting Drifts by Nonparametric Methods
- Combining Process and Product Control for Reducing Sampling Costs
- Modelling of Explosives Sensitivity Part 2: The Weibull-Model
- Modified Tightened Three Level Continuous Sampling Plan
- A Note on the Continuous Sampling Plan CSP-V
Artikel in diesem Heft
- Determination of Specifications for Tensile Strength of Castings
- Joint Design of Economic Manufacturing Quantity, Sampling Plan and Specification Limits
- Measurement Procedures for the Variance of a Normal Distribution
- A Bayesian View on Detecting Drifts by Nonparametric Methods
- Combining Process and Product Control for Reducing Sampling Costs
- Modelling of Explosives Sensitivity Part 2: The Weibull-Model
- Modified Tightened Three Level Continuous Sampling Plan
- A Note on the Continuous Sampling Plan CSP-V
