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A Note on the Continuous Sampling Plan CSP-V
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Chung-Ho Chen
Published/Copyright:
February 18, 2010
Abstract
This note investigates the problem of minimizing the average fraction inspected (AFI) for a CSP – V plan. A solution procedure is developed to find the sampling plan parameters that meet the average outgoing quality limit (AOQL) requirement, while minimizing the AFI when the process average (> AOQL) is known.
Key Words:: Continuous Sampling Plan; Average Outgoing Quality (AOQ); Average Outgoing Quality Limit (AOQL); Average Fraction Inspected (AFI)
Published Online: 2010-02-18
Published in Print: 2002-October
© Heldermann Verlag
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Articles in the same Issue
- Determination of Specifications for Tensile Strength of Castings
- Joint Design of Economic Manufacturing Quantity, Sampling Plan and Specification Limits
- Measurement Procedures for the Variance of a Normal Distribution
- A Bayesian View on Detecting Drifts by Nonparametric Methods
- Combining Process and Product Control for Reducing Sampling Costs
- Modelling of Explosives Sensitivity Part 2: The Weibull-Model
- Modified Tightened Three Level Continuous Sampling Plan
- A Note on the Continuous Sampling Plan CSP-V
Keywords for this article
Continuous Sampling Plan;
Average Outgoing Quality (AOQ);
Average Outgoing Quality Limit (AOQL);
Average Fraction Inspected (AFI)
Articles in the same Issue
- Determination of Specifications for Tensile Strength of Castings
- Joint Design of Economic Manufacturing Quantity, Sampling Plan and Specification Limits
- Measurement Procedures for the Variance of a Normal Distribution
- A Bayesian View on Detecting Drifts by Nonparametric Methods
- Combining Process and Product Control for Reducing Sampling Costs
- Modelling of Explosives Sensitivity Part 2: The Weibull-Model
- Modified Tightened Three Level Continuous Sampling Plan
- A Note on the Continuous Sampling Plan CSP-V
