Startseite Focused ion beam and transmission electron microscopy as a powerful tool to understand localized corrosion phenomena
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Focused ion beam and transmission electron microscopy as a powerful tool to understand localized corrosion phenomena

  • Edoardo Bemporad , Marco Sebastiani , Daniele De Felicis , Vincenzo Mangione und Fabio Carassiti
Veröffentlicht/Copyright: 3. Oktober 2011

Published Online: 2011-10-03
Published in Print: 2011-11-01

©2011 by Walter de Gruyter Berlin Boston

Heruntergeladen am 1.10.2025 von https://www.degruyterbrill.com/document/doi/10.1515/CORRREV.2011.013/html
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