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Chapters in this book
- Frontmatter I
- Editorial/Foreword V
- Contents VII
- Subthreshold Behaviors of Nanoscale Silicon and Germanium Junctionless Cylindrical Surrounding-Gate MOSFETs 1
- Silicon-on-Insulator for Spintronic Applications: Spin Lifetime and Electric Spin Manipulation 29
- Multilevel Cell Storage and Resistance Variability in Resistive Random Access Memory 49
- Resistive Switching Characteristics and Mechanisms in Silicon Oxide Memory Devices 73
- A Synaptic Device Built in One Diode–One Resistor (1D–1R) Architecture with Intrinsic SiOx-Based Resistive Switching Memory 91
- On-chip Wide Range Bidirectional Current Sensor for Li-ion Battery Management System 113
- A 12-bit 1-MS/s 26-μW SAR ADC for Sensor Applications 135
- A 5.2/5.8 GHz Dual Band On-Off Keying Transmitter Design for Bio-Signal Transmission 159
- Impacts of ESD Reliability by Different Layout Engineering in the 0.25-μm 60-V High-Voltage LDMOS Devices 177
- Impact-Based Area Allocation for Yield Optimization in Integrated Circuits 199
- Editors 215
- List of authors 217
Chapters in this book
- Frontmatter I
- Editorial/Foreword V
- Contents VII
- Subthreshold Behaviors of Nanoscale Silicon and Germanium Junctionless Cylindrical Surrounding-Gate MOSFETs 1
- Silicon-on-Insulator for Spintronic Applications: Spin Lifetime and Electric Spin Manipulation 29
- Multilevel Cell Storage and Resistance Variability in Resistive Random Access Memory 49
- Resistive Switching Characteristics and Mechanisms in Silicon Oxide Memory Devices 73
- A Synaptic Device Built in One Diode–One Resistor (1D–1R) Architecture with Intrinsic SiOx-Based Resistive Switching Memory 91
- On-chip Wide Range Bidirectional Current Sensor for Li-ion Battery Management System 113
- A 12-bit 1-MS/s 26-μW SAR ADC for Sensor Applications 135
- A 5.2/5.8 GHz Dual Band On-Off Keying Transmitter Design for Bio-Signal Transmission 159
- Impacts of ESD Reliability by Different Layout Engineering in the 0.25-μm 60-V High-Voltage LDMOS Devices 177
- Impact-Based Area Allocation for Yield Optimization in Integrated Circuits 199
- Editors 215
- List of authors 217