Mossbauer Spectroscopy and its Application to Materials Research

Saburo Nasu,

doi:10.1515/HTMP.1998.17.1-2.45

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Mossbauer Spectroscopy and its Application to Materials Research

Saburo Nasu,

Published/Copyright: May 6, 2011

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From the journal High Temperature Materials and Processes Volume 17 Issue 1-2

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Nasu,, Saburo. "Mossbauer Spectroscopy and its Application to Materials Research" High Temperature Materials and Processes, vol. 17, no. 1-2, 1998, pp. 45-56. https://doi.org/10.1515/HTMP.1998.17.1-2.45

Nasu,, S. (1998). Mossbauer Spectroscopy and its Application to Materials Research. High Temperature Materials and Processes, 17(1-2), 45-56. https://doi.org/10.1515/HTMP.1998.17.1-2.45

Nasu,, S. (1998) Mossbauer Spectroscopy and its Application to Materials Research. High Temperature Materials and Processes, Vol. 17 (Issue 1-2), pp. 45-56. https://doi.org/10.1515/HTMP.1998.17.1-2.45

Nasu,, Saburo. "Mossbauer Spectroscopy and its Application to Materials Research" High Temperature Materials and Processes 17, no. 1-2 (1998): 45-56. https://doi.org/10.1515/HTMP.1998.17.1-2.45

Nasu, S. Mossbauer Spectroscopy and its Application to Materials Research. High Temperature Materials and Processes. 1998;17(1-2): 45-56. https://doi.org/10.1515/HTMP.1998.17.1-2.45

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Published Online: 2011-05-06

Published in Print: 1998-01

Articles in the same Issue

TABLE OF CONTENTS
Preface
Surface Segregated Layer and Native Oxide Layer Formed on High-Purity Iron Base Alloys by Angle-Resolved XPS
Sputter Depth Profiling of Thin Films
Use of Post-Ionisation Techniques to Complement SIMS Analysis. A Review With Practical Aspects
Mossbauer Spectroscopy and its Application to Materials Research
Positron Annihilation Method: Thermal and Non-Thermal Defects in Refractory Intermetallics
Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
REVIEW: Quantitative Transmission Electron Microscopy with Imaging Plates
Glow Discharge Optical Emission Spectroscopy- The Fundamental Principles
Structural Characterization of Surfaces and Interfaces of Materials by Applying X-ray Total External Reflection Phenomena
Structural Studies of Aqueous Solutions by the Anomalous X-ray Scattering Method

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Articles in the same Issue

TABLE OF CONTENTS
Preface
Surface Segregated Layer and Native Oxide Layer Formed on High-Purity Iron Base Alloys by Angle-Resolved XPS
Sputter Depth Profiling of Thin Films
Use of Post-Ionisation Techniques to Complement SIMS Analysis. A Review With Practical Aspects
Mossbauer Spectroscopy and its Application to Materials Research
Positron Annihilation Method: Thermal and Non-Thermal Defects in Refractory Intermetallics
Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
REVIEW: Quantitative Transmission Electron Microscopy with Imaging Plates
Glow Discharge Optical Emission Spectroscopy- The Fundamental Principles
Structural Characterization of Surfaces and Interfaces of Materials by Applying X-ray Total External Reflection Phenomena
Structural Studies of Aqueous Solutions by the Anomalous X-ray Scattering Method