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Parametric Bivariate Regression Analysis Based on Censored Samples: A Weibull Model
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David D. Hanagal
Published/Copyright:
March 10, 2010
Abstract
In this paper, we propose a new bivariateWeibull distribution and derive estimation and test procedures based on censored samples with common covariates. The study of bivariate Weibull was motivated by interesting biometrical applications. The maximum likelihood estimators for the model parameters are obtained together with a test of significance.
Published Online: 2010-03-10
Published in Print: 2004-April
© Heldermann Verlag
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Articles in the same Issue
- Economic Design of A Dynamic CCC – r Chart for High-Yield Processes
- A Note on Average Run Lengths of Moving Average Control Charts
- A Group Runs Control Chart for Detecting Shifts in the Process Mean
- A Capability Index Calibrated to the Nonconformance Probability
- Stochastic Methods for Production Processes
- Parametric Bivariate Regression Analysis Based on Censored Samples: A Weibull Model
- A Note on Savings in Experimental Time Under Type II Censoring
- Expected Time for Attainment Threshold Level A Shock Model Approach
- Maintenance Models for a Repairable System
- Minimum Average Fraction Inspected for Combined Continuous Lot by Lot Acceptance Sampling Plan
- Minimum Risk Acceptance Sampling Plans: A Review
- Improving Resistivity of Resin
